Author: Publisher:
ISBN:
Category : Electron beams
Languages : en
Pages : 1048
Book Description
Proceedings of the Symposium on Electron and Ion Beam Science and Technology; International Conference
Author: Proceedings of the Symposium on Electron and Ion Beam Science and Technology
Author: Robert BakishPublisher: The Electrochemical Society
ISBN:
Category : Electron beam welding
Languages : en
Pages : 644
Book Description
Proceedings of the ... Symposium on Electron, Ion and Laser Beam Technology
Author: Nuclear Science Abstracts
Author: Catalog of Copyright Entries. Third Series
Author: Library of Congress. Copyright OfficePublisher: Copyright Office, Library of Congress
ISBN:
Category : Copyright
Languages : en
Pages : 1642
Book Description
Proceedings
Author: Scientific and Technical Aerospace Reports
Author: Index to Conferences Relating to Nuclear Science
Author: Willie E. ClarkPublisher:
ISBN:
Category : Nuclear physics
Languages : en
Pages : 220
Book Description
Secondary Ion Mass Spectrometry SIMS III
Author: A. BenninghovenPublisher: Springer Science & Business Media
ISBN: 3642881521
Category : Science
Languages : en
Pages : 455
Book Description
Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Author: