Author: Takeo Hattori
Publisher:
ISBN:
Category :
Languages : en
Pages : 856
Book Description
Proceedings of the Second International Conference on the Control of Semiconductor Interfaces
Proceedings of the second International Conference on the Formation of Semiconductor Interfaces
ICFSI-2 : proceedings of the second International Conference on the Formation of Semiconductor Interfaces ; Takarazuka, Japan, November 8 - 12, 1988
Author: Akio Hiraki
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 680
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 680
Book Description
Proceedings of the Second International Conference on Mechatronics and Automatic Control
Author: Wego Wang
Publisher: Springer
ISBN: 3319137077
Category : Technology & Engineering
Languages : en
Pages : 1180
Book Description
This book examines mechatronics and automatic control systems. The book covers important emerging topics in signal processing, control theory, sensors, mechanic manufacturing systems and automation. The book presents papers from the second International Conference on Mechatronics and Automatic Control Systems held in Beijing, China on September 20-21, 2014. Examines how to improve productivity through the latest advanced technologies Covering new systems and techniques in the broad field of mechatronics and automatic control systems
Publisher: Springer
ISBN: 3319137077
Category : Technology & Engineering
Languages : en
Pages : 1180
Book Description
This book examines mechatronics and automatic control systems. The book covers important emerging topics in signal processing, control theory, sensors, mechanic manufacturing systems and automation. The book presents papers from the second International Conference on Mechatronics and Automatic Control Systems held in Beijing, China on September 20-21, 2014. Examines how to improve productivity through the latest advanced technologies Covering new systems and techniques in the broad field of mechatronics and automatic control systems
Proceedings of the Second International Symposium on the Control of Semiconductor Interfaces
Author: ISCSI. 2, 1996, Karuizawa
Publisher:
ISBN:
Category :
Languages : en
Pages : 856
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 856
Book Description
ISCSI-2
Proceedings of the Second International Conference on Synchrotron Radiation in Materials Science, October 31-November 3, 1998, Kobe, Japan
Author: Teikichi A. Sasaki
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 688
Book Description
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 688
Book Description
Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing
Author: M. Meyyappan
Publisher: The Electrochemical Society
ISBN: 9781566771368
Category : Technology & Engineering
Languages : en
Pages : 366
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566771368
Category : Technology & Engineering
Languages : en
Pages : 366
Book Description
Control of Semiconductor Interfaces
Author: I. Ohdomari
Publisher: Elsevier
ISBN: 1483290484
Category : Science
Languages : en
Pages : 600
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Publisher: Elsevier
ISBN: 1483290484
Category : Science
Languages : en
Pages : 600
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization including STM and SR techniques, single ion implementation, self-organization crystal growth, in situ measurements for process control and extremely high-spatial resolution analysis techniques, are also included. Furthermore it bridges the macroscopic, mesoscopic, and atomic-scale regimes of semicondutor interfaces, describing the state of the art in forming, controlling and characterizating unique semiconductor interfaces, which will be of practical importance in advanced devices. Intended for both technologists who require an up-to-date assessment of methods for interface formation, processing and characterization, and solid state researchers who desire the latest developments in understanding the basic mechanisms of interface physics, chemistry and electronics, this book will be a welcome addition to the existing literature.
Control of Semiconductor Interfaces
Author: Iwao Ohdomari
Publisher: Elsevier Publishing Company
ISBN: 9780444818898
Category : Science
Languages : en
Pages : 583
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in...
Publisher: Elsevier Publishing Company
ISBN: 9780444818898
Category : Science
Languages : en
Pages : 583
Book Description
This book focuses exclusively on control of interfacial properties and structures for semiconductor device applications from the point of view of improving and developing novel electrical properties. The following topics are covered: metal-semiconductors, semiconductor hetero-interfaces, characterization, semiconducting new materials, insulator-semiconductor, interfaces in device, control of interface formation, control of interface properties, contact metallization. A variety of up-to-date research topics such as atomic layer epitaxy, atomic layer passivation, atomic scale characterization in...