Proceedings of the second International Conference on Charged Particle Optics PDF Download

Author: International Conference on Charged Particle Optics (2, 1986, Albuquerque, NM)
Publisher:
ISBN:
Category :
Languages : en
Pages : 318

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Author:
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Category : Electron optics
Languages : en
Pages : 13

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Author: Jon Orloff
Publisher: CRC Press
ISBN: 1420045555
Category : Science
Languages : en
Pages : 666

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With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128134054
Category : Science
Languages : en
Pages : 767

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Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0081022573
Category : Science
Languages : en
Pages : 729

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Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323916473
Category : Technology & Engineering
Languages : en
Pages : 665

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Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. Includes authoritative coverage of many recent developments in wave electron optics Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562

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Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

Author:
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ISBN:
Category : Electrostatic precipitation
Languages : en
Pages : 1144

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Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 516

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Author: Hermann Wollnik
Publisher: Academic Press
ISBN: 012821466X
Category : Science
Languages : en
Pages : 319

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Book Description
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition