Author: G. R. SrinivasanPublisher: The Electrochemical Society
ISBN: 9781566771542
Category : Science
Languages : en
Pages : 546
Book Description
Proceedings of the Fourth International Symposium of Process Physics and Modeling in Semiconductor Technology
Author: G. R. SrinivasanPublisher: The Electrochemical Society
ISBN: 9781566771542
Category : Science
Languages : en
Pages : 546
Book Description
Proceedings of the Fourth International Symposium on High Purity Silicon
Author: Cor L. ClaeysPublisher: The Electrochemical Society
ISBN: 9781566771566
Category : Science
Languages : en
Pages : 606
Book Description
Semiconductor Technology (ISTC 2001)
Author: Ming YangPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 688
Book Description
Integrated Circuit Fabrication
Author: James D. PlummerPublisher: Cambridge University Press
ISBN: 1009303570
Category : Technology & Engineering
Languages : en
Pages : 680
Book Description
Master fundamental technologies for modern semiconductor integrated circuits with this definitive textbook, for students from a range of STEM backgrounds, with a focus on big-picture thinking and industry-grade simulation. Includes over 450 full-color figures and over 280 homework problems, with solutions and lecture slides for instructors.
Temperature Measurement during Millisecond Annealing
Author: Denise ReichelPublisher: Springer
ISBN: 365811388X
Category : Science
Languages : en
Pages : 128
Book Description
Denise Reichel studies the delicate subject of temperature measurement during lamp-based annealing of semiconductors, in particular during flash lamp annealing. The approach of background-correction using amplitude-modulated light to obtain the sample reflectivity is reinvented from rapid thermal annealing to apply to millisecond annealing. The author presents a new method independent of the lamp operation to obtain this amplitude modulation and derives a formula to describe the process. Further, she investigates the variables of the formula in depth to validate the method’s suitability for background-corrected temperature measurement. The experimental results finally proof its power for elevated temperatures.
Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding
Author: U. GöselePublisher: The Electrochemical Society
ISBN: 9781566771894
Category : Technology & Engineering
Languages : en
Pages : 636
Book Description
Index of Conference Proceedings
Author: British Library. Document Supply CentrePublisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 836
Book Description
Scientific and Technical Aerospace Reports
Author: Electrical & Electronics Abstracts
Author: Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 2304
Book Description
Proceedings of the Symposium Om Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing
Author: M. MeyyappanPublisher: The Electrochemical Society
ISBN: 9781566770965
Category : Technology & Engineering
Languages : en
Pages : 644
Book Description