Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Proceedings of the ... Annual Symposium on Frequency Control
Author:
Publisher:
ISBN:
Category : Oscillators, Crystal
Languages : en
Pages : 378
Book Description
Publisher:
ISBN:
Category : Oscillators, Crystal
Languages : en
Pages : 378
Book Description
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Frequency and Time
Author: B. E. Blair
Publisher:
ISBN:
Category : Frequency standards
Languages : en
Pages : 576
Book Description
Publisher:
ISBN:
Category : Frequency standards
Languages : en
Pages : 576
Book Description
Frequency Stability
Author: Venceslav F. Kroupa
Publisher: John Wiley & Sons
ISBN: 111831011X
Category : Technology & Engineering
Languages : en
Pages : 330
Book Description
An in-depth look at the theory and applications of frequency stability An understanding of the acquisition of stable frequency is essential for anyone who needs to solve noise problems in wireless communications. This book offers a thorough introduction to the principles and applications of frequency stability, arming practicing engineers with the tools they need to minimize noise in systems and devices that affect everyday communications for millions of people. With an emphasis on both practical and scientific points of view, Frequency Stability: Introduction and Applications examines frequency and time fluctuations in resonators, as well as the stability of both standard and practical microwave oscillators. It explains noise properties of building circuit blocks, introducing time domain properties and how they relate to noise spectral densities. Including a special chapter devoted to the design and properties of phase locked loops—a crucial topic for frequency synthesizers—the book also: Examines in detail L/F noise, showing how power losses in the propagation material extend over a long period of time Covers sapphire, optoelectronics, MW, and ring oscillators with the discussion of noise in delay-line oscillators with lasers Offers an extended treatment of phase noise in semiconductors and amplifiers based on Van der Ziel investigations Emphasizes the modified Allan variance in the time domain, including exact computations Outlines the relationship between resonator frequency and output phase noises via the feedback theory Featuring numerous tables with actual data, Frequency Stability: Introduction and Applications is an invaluable guide for engineers wishing to rein in acoustic and electromagnetic interference in modern communications.
Publisher: John Wiley & Sons
ISBN: 111831011X
Category : Technology & Engineering
Languages : en
Pages : 330
Book Description
An in-depth look at the theory and applications of frequency stability An understanding of the acquisition of stable frequency is essential for anyone who needs to solve noise problems in wireless communications. This book offers a thorough introduction to the principles and applications of frequency stability, arming practicing engineers with the tools they need to minimize noise in systems and devices that affect everyday communications for millions of people. With an emphasis on both practical and scientific points of view, Frequency Stability: Introduction and Applications examines frequency and time fluctuations in resonators, as well as the stability of both standard and practical microwave oscillators. It explains noise properties of building circuit blocks, introducing time domain properties and how they relate to noise spectral densities. Including a special chapter devoted to the design and properties of phase locked loops—a crucial topic for frequency synthesizers—the book also: Examines in detail L/F noise, showing how power losses in the propagation material extend over a long period of time Covers sapphire, optoelectronics, MW, and ring oscillators with the discussion of noise in delay-line oscillators with lasers Offers an extended treatment of phase noise in semiconductors and amplifiers based on Van der Ziel investigations Emphasizes the modified Allan variance in the time domain, including exact computations Outlines the relationship between resonator frequency and output phase noises via the feedback theory Featuring numerous tables with actual data, Frequency Stability: Introduction and Applications is an invaluable guide for engineers wishing to rein in acoustic and electromagnetic interference in modern communications.
NIST Technical Note
Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 558
Book Description
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 558
Book Description
Metrology and Fundamental Constants
Author: Theo W. Hänsch
Publisher: IOS Press
ISBN: 1586037846
Category : Computers
Languages : en
Pages : 683
Book Description
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
Publisher: IOS Press
ISBN: 1586037846
Category : Computers
Languages : en
Pages : 683
Book Description
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
Recent Advances in Metrology and Fundamental Constants
Author: T.J. Quinn
Publisher: IOS Press
ISBN: 1614990026
Category : Science
Languages : en
Pages : 836
Book Description
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.
Publisher: IOS Press
ISBN: 1614990026
Category : Science
Languages : en
Pages : 836
Book Description
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.
Applications of Digital Signal Processing
Author: Christian Cuadrado-Laborde
Publisher: BoD – Books on Demand
ISBN: 953307406X
Category : Computers
Languages : en
Pages : 414
Book Description
In this book the reader will find a collection of chapters authored/co-authored by a large number of experts around the world, covering the broad field of digital signal processing. This book intends to provide highlights of the current research in the digital signal processing area, showing the recent advances in this field. This work is mainly destined to researchers in the digital signal processing and related areas but it is also accessible to anyone with a scientific background desiring to have an up-to-date overview of this domain. Each chapter is self-contained and can be read independently of the others. These nineteenth chapters present methodological advances and recent applications of digital signal processing in various domains as communications, filtering, medicine, astronomy, and image processing.
Publisher: BoD – Books on Demand
ISBN: 953307406X
Category : Computers
Languages : en
Pages : 414
Book Description
In this book the reader will find a collection of chapters authored/co-authored by a large number of experts around the world, covering the broad field of digital signal processing. This book intends to provide highlights of the current research in the digital signal processing area, showing the recent advances in this field. This work is mainly destined to researchers in the digital signal processing and related areas but it is also accessible to anyone with a scientific background desiring to have an up-to-date overview of this domain. Each chapter is self-contained and can be read independently of the others. These nineteenth chapters present methodological advances and recent applications of digital signal processing in various domains as communications, filtering, medicine, astronomy, and image processing.
Metrology and Physical Constants
Author: A. Di Giuseppe
Publisher: IOS Press
ISBN: 1614993262
Category : Science
Languages : en
Pages : 567
Book Description
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Publisher: IOS Press
ISBN: 1614993262
Category : Science
Languages : en
Pages : 567
Book Description
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Precision Measurement and Calibration: Frequency and time, B. E. Blair and A. H. Morgan, editors
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 580
Book Description
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 580
Book Description