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Author: Peter W. Hawkes Publisher: Elsevier ISBN: 0081022573 Category : Science Languages : en Pages : 729
Book Description
Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text
Author: Peter W. Hawkes Publisher: Elsevier ISBN: 0081022573 Category : Science Languages : en Pages : 729
Book Description
Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text
Author: Publisher: Academic Press ISBN: 0128025905 Category : Technology & Engineering Languages : en Pages : 269
Book Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field
Author: Z H Zhai Publisher: World Scientific ISBN: 9814554820 Category : Languages : en Pages : 662
Book Description
This unique one-volume handbook provides a quick and concise reference guide for practising ophthalmologists, retinal specialists, vitreo-retinal fellows, ophthalmology residents and optometrists on the latest recommendations for managing common vitreo-retinal disorders seen in everyday retina practise. It provides comprehensive and essential information on diagnosis and management in outline and table format for conciseness and quick access. Color illustrations of important clinical manifestations are provided in an appendix.Dr Susanna Park is a Professor of ophthalmology and Director of Vitreo-retinal Fellowship and Ocular Oncology at the University of California Davis Eye Center. She has over 20 years clinical experience as a vitreo-retinal specialist and published over 100 journal papers and book chapters on the subject.
Author: Peter W. Hawkes Publisher: Academic Press ISBN: 0128134054 Category : Science Languages : en Pages : 767
Book Description
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text
Author: Yi Peng Publisher: Springer Science & Business Media ISBN: 354079039X Category : Technology & Engineering Languages : en Pages : 787
Book Description
This volume presents the proceedings of the 7th Asian-Pacific Conference on Medical and Biological Engineering (APCMBE 2008). Themed "Biomedical Engineering – Promoting Sustainable Development of Modern Medicine" the proceedings address a broad spectrum of topics from Bioengineering and Biomedicine, like Biomaterials, Artificial Organs, Tissue Engineering, Nanobiotechnology and Nanomedicine, Biomedical Imaging, Bio MEMS, Biosignal Processing, Digital Medicine, BME Education. It helps medical and biological engineering professionals to interact and exchange their ideas and experiences.
Author: Peter W. Hawkes Publisher: Academic Press ISBN: 0128189800 Category : Technology & Engineering Languages : en Pages : 562
Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Author: Peter W. Hawkes Publisher: Academic Press ISBN: 0080962432 Category : Science Languages : en Pages : 599
Book Description
This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoretical background and modern computing methods. It contains a detailed and unique account of numerical methods and an extensive bibliography.
Author: Peter W. Hawkes
Author: Peter W. Hawkes
Author: 
Author: Z H Zhai
Author: Geological Society of Malaysia. Geological Conference
Author: Peter W. Hawkes
Author: Ke-hsin Kuo
Author: Yi Peng
Author: Peter W. Hawkes
Author: Peter W. Hawkes
Author: British Library. Document Supply Centre