Author:
Publisher:
ISBN:
Category : X-rays
Languages : en
Pages :
Book Description
Proceedings of the 58th Annual Conference on Applications of X-ray Analysis : (Denver X-ray Conference), 27 - 31 July 2009, Crowne Plaza Hotel, Colorado Springs, Colorado, U.S.A.
Advances in X-ray Analysis
Proceedings of the 51st Annual Conference on Applications of X-ray Analysis
Proceedings of the 56th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference).
Advances in X-ray Analysis
Proceedings of the 49th Annual Conference on Applications of X-Ray Analysis
Author: Optical Archives Inc. (Laguna, Calif.)
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Proceedings of the 54th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference).
Advances in X-ray Analysis
Author: International Centre for Diffraction Data
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Advances in X-Ray Analysis
Author: Gavin R. Mallett
Publisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Publisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.