Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 30 June - 4 July, 2014, Marina Bay Sands, Singapore PDF Download

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Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 30 June - 4 July, 2014, Marina Bay Sands, Singapore

Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 30 June - 4 July, 2014, Marina Bay Sands, Singapore PDF Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :

Book Description

Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 30 June - 4 July, 2014, Marina Bay Sands, Singapore

Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 30 June - 4 July, 2014, Marina Bay Sands, Singapore PDF Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :

Book Description

2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) PDF Author:
Publisher:
ISBN: 9781479939299
Category : Integrated circuits
Languages : en
Pages :

Book Description

ISTFA 2014

ISTFA 2014 PDF Author: A. S. M. International
Publisher: ASM International
ISBN: 1627080740
Category : Technology & Engineering
Languages : en
Pages : 561

Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits PDF Author: Philip Ho
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780377226
Category : Integrated circuits
Languages : en
Pages : 220

Book Description
This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.

Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the

Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the PDF Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :

Book Description

Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits PDF Author:
Publisher:
ISBN: 9781509085309
Category : Electronic book
Languages : en
Pages : 309

Book Description

Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits PDF Author: Souvik Mahapatra
Publisher: IEEE Computer Society Press
ISBN: 9781424410149
Category : Technology & Engineering
Languages : en
Pages : 309

Book Description

Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the

Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the PDF Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :

Book Description

Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits PDF Author: Lawrence C. Wagner
Publisher: Springer Science & Business Media
ISBN: 1461549191
Category : Technology & Engineering
Languages : en
Pages : 256

Book Description
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

ISTFA 2013

ISTFA 2013 PDF Author: A. S. M. International
Publisher: ASM International
ISBN: 1627080228
Category : Technology & Engineering
Languages : en
Pages : 634

Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
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