Author:
Publisher:
ISBN: 9780780329911
Category :
Languages : en
Pages : 0
Book Description
Proceedings International Test Conference 1995
Proceedings, International Test Conference 1995
Author:
Publisher: Conference
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1032
Book Description
Publisher: Conference
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1032
Book Description
International Test Conference 1995
The European Design and Test Conference: ED and TC 1995: Proceedings of the European Design and Test Conference (1995: Paris, France
Proceedings, International Test Conference 1997
Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1074
Book Description
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1074
Book Description
Driving Down the Cost of Test
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 1011
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 1011
Book Description
International Test Conference 1995
Proceedings
Author: International Test Conference
Publisher:
ISBN: 9780780329911
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9780780329911
Category :
Languages : en
Pages :
Book Description
Introduction to IDDQ Testing
Author: S. Chakravarty
Publisher: Springer Science & Business Media
ISBN: 146156137X
Category : Technology & Engineering
Languages : en
Pages : 336
Book Description
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Publisher: Springer Science & Business Media
ISBN: 146156137X
Category : Technology & Engineering
Languages : en
Pages : 336
Book Description
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Author: Manoj Sachdev
Publisher: Springer Science & Business Media
ISBN: 0387465472
Category : Technology & Engineering
Languages : en
Pages : 343
Book Description
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Publisher: Springer Science & Business Media
ISBN: 0387465472
Category : Technology & Engineering
Languages : en
Pages : 343
Book Description
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.