Author: International Test Conference
Publisher:
ISBN: 9780780314290
Category :
Languages : en
Pages :
Book Description
Proceedings / International Test Conference. 1993. Designing, testing, and diagnostics - join them : October 17 - 21, 1993, Convention Center, Baltimore, Maryland, USA
Author: International Test Conference
Publisher:
ISBN: 9780780314290
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN: 9780780314290
Category :
Languages : en
Pages :
Book Description
International Test Conference 1993
Designing, Testing, and Diagnostics--join Them
Author:
Publisher:
ISBN: 9780780314306
Category : Automatic test equipment
Languages : en
Pages : 1065
Book Description
Publisher:
ISBN: 9780780314306
Category : Automatic test equipment
Languages : en
Pages : 1065
Book Description
Designing, Testing, and Diagnostics--join Them
Author: IEEE Computer Society. Test Technology Technical Committee
Publisher:
ISBN:
Category :
Languages : en
Pages : 1065
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 1065
Book Description
Proceedings International Test Conference
Proceedings
Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1065
Book Description
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1065
Book Description
International Test Conference, 1992
Author: Institute of Electrical and Electronics Engineers
Publisher: Conference
ISBN:
Category : Automatic checkout equipment
Languages : en
Pages : 1032
Book Description
Annotation The proceedings of the 23rd edition of the premier technical conference on electronic testing, held in Baltimore, Maryland, September 1992, comprise papers, panels, and tutorials in the areas of design and test integration; test management; software; test hardware; device, assembly, and system test; and IEEE test standards. ITC's 1992 theme, Discover the New World of Test and Design, reflects the growing emphasis on tighter integration of test and design to assure the highest quality products. No subject index. Ruggedly bound for heavy use. Annotation copyrighted by Book News, Inc., Portland, OR.
Publisher: Conference
ISBN:
Category : Automatic checkout equipment
Languages : en
Pages : 1032
Book Description
Annotation The proceedings of the 23rd edition of the premier technical conference on electronic testing, held in Baltimore, Maryland, September 1992, comprise papers, panels, and tutorials in the areas of design and test integration; test management; software; test hardware; device, assembly, and system test; and IEEE test standards. ITC's 1992 theme, Discover the New World of Test and Design, reflects the growing emphasis on tighter integration of test and design to assure the highest quality products. No subject index. Ruggedly bound for heavy use. Annotation copyrighted by Book News, Inc., Portland, OR.
International Test Conference, 1993
Author:
Publisher: Conference
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1090
Book Description
Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.
Publisher: Conference
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 1090
Book Description
Annotation Proceedings of the 24th International Test Conference held in Baltimore, October 1993--the premier conference for the testing of electronic devices, assemblies, and systems, including design for testability and diagnostics. This year's leading edge topics are mixed-signal testing, multichip modules, systems test, automatic synthesis of test structures in design, boundary scan, and Iddq. Core topics represented included ATPG, modeling, test equipment hardware, delay fault testing, software testing, DFT, applied BIST, board testing, memory and microprocessor testing, test economics, and test quality and reliability. Annotation copyright by Book News, Inc., Portland, OR.
Discover the New World of Test and Design
Author:
Publisher:
ISBN:
Category : Automatic checkout equipment
Languages : en
Pages : 1012
Book Description
Publisher:
ISBN:
Category : Automatic checkout equipment
Languages : en
Pages : 1012
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1012
Book Description
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 1012
Book Description