Author: Electron Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 936
Book Description
Proceedings, ... Annual Meeting, Electron Microscopy Society of America
Author: Electron Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 936
Book Description
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 936
Book Description
Proceedings ... Annual Meeting, Electron Microscopy Society of America
Author: Electron Microscopy Society of America
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 588
Book Description
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 588
Book Description
The Growth of Electron Microscopy
Author:
Publisher: Academic Press
ISBN: 0080577628
Category : Science
Languages : en
Pages : 919
Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Publisher: Academic Press
ISBN: 0080577628
Category : Science
Languages : en
Pages : 919
Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).
Advances in Imaging and Electron Physics
Author:
Publisher: Academic Press
ISBN: 0128025905
Category : Technology & Engineering
Languages : en
Pages : 269
Book Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field
Publisher: Academic Press
ISBN: 0128025905
Category : Technology & Engineering
Languages : en
Pages : 269
Book Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field
Proceedings, ... Annual Meeting, Electron Microscopy Society of America
Author: Electron Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 1014
Book Description
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 1014
Book Description
Proceedings ... Annual Meeting, Microscopy Society of America
Author: Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 1292
Book Description
Publisher:
ISBN:
Category : Electron microscopy
Languages : en
Pages : 1292
Book Description
X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK
Author: P.B. Kenway
Publisher: CRC Press
ISBN: 1000157083
Category : Science
Languages : en
Pages : 684
Book Description
The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
Publisher: CRC Press
ISBN: 1000157083
Category : Science
Languages : en
Pages : 684
Book Description
The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
NIST Serial Holdings
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 268
Book Description
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 268
Book Description
Proceedings ... Annual Meeting, Electron Microscopy Society of America
Author: Electron Microscopy Society of America
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 588
Book Description
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 588
Book Description
Publications of the National Bureau of Standards, 1976 Catalog
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages : 742
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 742
Book Description