Proceedings, ... Annual Meeting, Electron Microscopy Society of America PDF Download

Author: Electron Microscopy Society of America. Meeting
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 456

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Author:
Publisher: Academic Press
ISBN: 0080577628
Category : Science
Languages : en
Pages : 919

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Book Description
As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Author:
Publisher: Academic Press
ISBN: 0128025905
Category : Technology & Engineering
Languages : en
Pages : 269

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Book Description
Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1516

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A keyword listing of serial titles currently received by the National Library of Medicine.

Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 698

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Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323915086
Category : Technology & Engineering
Languages : en
Pages : 452

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Book Description
The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in "Advances in Imaging and Electron Physics" series

Author: John Hutchison
Publisher: Royal Society of Chemistry
ISBN: 1847557929
Category : Science
Languages : en
Pages : 319

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Chemical characterisation techniques have been essential tools in underpinning the explosion in nanotechnology in recent years and nanocharacterisation is a rapidly developing field. Contributions in this book from leading teams across the globe provide an overview of the different microscopic techniques now in regular use for the characterisation of nanostructures. Essentially a handbook to all working in the field this indispensable resource provides a survey of microscopy based techniques with experimental procedures and extensive examples of state of the art characterisation methods including: Transmission Electron Microscopy, Electron Tomography, Tunneling Microscopy, Electron Holography, Electron Energy Loss Spectroscopy. This timely publication will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.

Author: National Agricultural Library (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 1338

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Author:
Publisher:
ISBN:
Category : AGRICOLA (Information retrieval system)
Languages : en
Pages : 212

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Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0192566083
Category : Science
Languages : en
Pages : 550

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Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.