Proceedings, 2016 IEEE International Test Conference (ITC) PDF Download

Author:
Publisher:
ISBN: 9781467387736
Category :
Languages : en
Pages :

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Author: IEEE Staff
Publisher:
ISBN: 9781467387743
Category :
Languages : en
Pages :

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Book Description
International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers

Author: Xin-She Yang
Publisher: Springer Nature
ISBN: 9811916071
Category : Technology & Engineering
Languages : en
Pages : 910

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Book Description
This book gathers selected high-quality research papers presented at the Seventh International Congress on Information and Communication Technology, held at Brunel University, London, on February 21–24, 2022. It discusses emerging topics pertaining to information and communication technology (ICT) for managerial applications, e-governance, e-agriculture, e-education and computing technologies, the Internet of Things (IoT) and e-mining. Written by respected experts and researchers working on ICT, the book offers a valuable asset for young researchers involved in advanced studies. The work is presented in four volumes.

Author: Subhransu Sekhar Dash
Publisher: Springer
ISBN: 9811055203
Category : Technology & Engineering
Languages : en
Pages : 662

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Book Description
The book is a collection of best papers presented in International Conference on Intelligent Computing and Applications (ICICA 2016) organized by Department of Computer Engineering, D.Y. Patil College of Engineering, Pune, India during 20-22 December 2016. The book presents original work, information, techniques and applications in the field of computational intelligence, power and computing technology. This volume also talks about image language processing, computer vision and pattern recognition, machine learning, data mining and computational life sciences, management of data including Big Data and analytics, distributed and mobile systems including grid and cloud infrastructure.

Author: IEEE Staff
Publisher:
ISBN: 9781538634141
Category :
Languages : en
Pages :

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Book Description
International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers

Author: Sneh Saurabh
Publisher: Cambridge University Press
ISBN: 1009200801
Category :
Languages : en
Pages : 983

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Author: ASM International
Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages : 666

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Book Description
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

Author: Luis Norberto López de Lacalle
Publisher: MDPI
ISBN: 3039282905
Category : Technology & Engineering
Languages : en
Pages : 428

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Book Description
Modern factories are experiencing rapid digital transformation supported by emerging technologies, such as the Industrial Internet of things (IIOT), industrial big data and cloud technologies, deep learning and deep analytics, AI, intelligent robotics, cyber-physical systems and digital twins, complemented by visual computing (including new forms of artificial vision with machine learning, novel HMI, simulation, and visualization). This is evident in the global trend of Industry 4.0. The impact of these technologies is clear in the context of high-performance manufacturing. Important improvements can be achieved in productivity, systems reliability, quality verification, etc. Manufacturing processes, based on advanced mechanical principles, are enhanced by big data analytics on industrial sensor data. In current machine tools and systems, complex sensors gather useful data, which is captured, stored, and processed with edge, fog, or cloud computing. These processes improve with digital monitoring, visual data analytics, AI, and computer vision to achieve a more productive and reliable smart factory. New value chains are also emerging from these technological changes. This book addresses these topics, including contributions deployed in production, as well as general aspects of Industry 4.0.

Author: George A. Tsihrintzis
Publisher: Springer
ISBN: 3030156281
Category : Technology & Engineering
Languages : en
Pages : 552

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Book Description
This book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and soft-copy form, books on all aspects of learning, analytics, advanced intelligent systems and related technologies. These disciplines are strongly related and mutually complementary; accordingly, the new series encourages an integrated approach to themes and topics in these disciplines, which will result in significant cross-fertilization, research advances and new knowledge creation. To maximize the dissemination of research findings, the series will publish edited books, monographs, handbooks, textbooks and conference proceedings. This book is intended for professors, researchers, scientists, engineers and students. An extensive list of references at the end of each chapter allows readers to probe further into those application areas that interest them most.

Author: Prabhat Mishra
Publisher: Springer
ISBN: 3319490257
Category : Technology & Engineering
Languages : en
Pages : 351

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Book Description
This book provides an overview of current Intellectual Property (IP) based System-on-Chip (SoC) design methodology and highlights how security of IP can be compromised at various stages in the overall SoC design-fabrication-deployment cycle. Readers will gain a comprehensive understanding of the security vulnerabilities of different types of IPs. This book would enable readers to overcome these vulnerabilities through an efficient combination of proactive countermeasures and design-for-security solutions, as well as a wide variety of IP security and trust assessment and validation techniques. This book serves as a single-source of reference for system designers and practitioners for designing secure, reliable and trustworthy SoCs.