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Author: Rozaliya I Barabash Publisher: World Scientific ISBN: 190897964X Category : Science Languages : en Pages : 478
Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: Rozaliya I Barabash Publisher: World Scientific ISBN: 190897964X Category : Science Languages : en Pages : 478
Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: Rozaliya Barabash Publisher: World Scientific ISBN: 1908979631 Category : Science Languages : en Pages : 478
Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: The Minerals, Metals & Materials Society (TMS) Publisher: John Wiley & Sons ISBN: 1118147715 Category : Technology & Engineering Languages : en Pages : 272
Book Description
In its most advanced form, Integrated Computational Materials Engineering (ICME) holistically integrates manufacturing simulation, advanced materials models and component performance analysis. This volume contains thirty-five papers presented at the 1st World Congress on Integrated Computational Materials Engineering. Modeling processing-microstructure relationships, modeling microstructure-property relationships, and the role of ICME in graduate and undergraduate education are discussed. Ideal as a primary text for engineering students, this book motivates a wider understanding of the advantages and limitations offered by the various computational (and coordinated experimental) tools of this field.
Author: Arief Suriadi Budiman Publisher: Springer ISBN: 981287335X Category : Technology & Engineering Languages : en Pages : 182
Book Description
This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystalline materials are mechanically deformed in small volumes, higher stresses are needed for plastic flow. This has been called the "Smaller is Stronger" phenomenon and has been widely observed. studies suggest that plasticity in one case is indeed controlled by the GNDs (strain gradient hardening), whereas in the other, plasticity is not controlled by strain gradients or sub-structure hardening, but rather by dislocation source starvation, wherein smaller volumes are stronger because fewer sources of dislocations are available (dislocation starvation hardening).
Author: Arief Suriadi Budiman Publisher: Springer Nature ISBN: 9811567204 Category : Science Languages : en Pages : 254
Book Description
This book addresses issues pertinent to mechanics and stress generation, especially in recent advanced cases of technology developments, spanning from micrometer interconnects in solar photovoltaics (PV), next-gen energy storage devices to multilayers of nano-scale composites enabling novel stretchable/flexible conductor technologies. In these cases, the mechanics of materials have been pushed to the extreme edges of human knowledge to enable cutting-edge, unprecedented functionalities and technological innovations. Synchrotron X-ray diffraction, in situ small-scale mechanical testing combined with physics-based computational modeling/simulation, has been widely used approaches to probe these mechanics of the materials at their extreme limits due to their recently discovered distinct advantages. The techniques discussed in this manuscript are highlights specially curated from the broad body of work recently reported in the literature, especially ones that the author had led the pursuits at the frontier himself. Extreme stress generation in these advanced material leads to often new failure modes, and hence, the reliability of the final product is directly affected. From the recent topics and various advanced case studies covered in this book, the reader gets an updated knowledge of how new mechanics can and has been applied in Design-for-Reliability (DfR) for some of the latest technological innovations known in our modern world. Further, this also helps in building better designs, which may avoid the pitfalls of the current practiced trends.
Author: Publisher: Elsevier ISBN: 0080524680 Category : Science Languages : en Pages : 681
Book Description
Dislocations are lines of irregularity in the structure of a solid analogous to the bumps in a badly laid carpet. Like these bumps they can be easily moved, and they provide the most important mechanism by which the solid can be deformed. They also have a strong influence on crystal growth and on the electronic properties of semiconductors.·Influence of dislocations on piezoelectric behavior·New mechanisms for hardening in twinned crystals·Bringing theories of martensite transformation into agreement·Atomic scale motion of dislocations in electron microscopy·Dislocation patterns deduced from X-ray diffraction·Role of dislocations in friction·Dislocation motion in quasicrystals
Author: Ulrich Messerschmidt Publisher: Springer Science & Business Media ISBN: 3642031773 Category : Science Languages : en Pages : 509
Book Description
Along with numerous illustrative examples, this text provides an overview of the dynamic behavior of dislocations and its relation to plastic deformation. It introduces the general properties of dislocations and treats the dislocation dynamics in some detail.
Author: Adam J. Schwartz Publisher: Springer Science & Business Media ISBN: 1475732058 Category : Technology & Engineering Languages : en Pages : 352
Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author: Rozaliya I Barabash
Author: Rozaliya I Barabash
Author: 
Author: Rozaliya Barabash
Author: The Minerals, Metals & Materials Society (TMS)
Author: Arief Suriadi Budiman
Author: Arief Suriadi Budiman
Author: 
Author: Ulrich Messerschmidt
Author: Vasisht Venkatesh
Author: Adam J. Schwartz