Principles of Electron Optics, Volume 4 PDF Download

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323916473
Category : Technology & Engineering
Languages : en
Pages : 665

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Book Description
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. - Includes authoritative coverage of many recent developments in wave electron optics - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128189800
Category : Technology & Engineering
Languages : en
Pages : 562

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Book Description
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0128134054
Category : Science
Languages : en
Pages : 767

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Book Description
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0081022573
Category : Science
Languages : en
Pages : 729

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Book Description
Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. - Offers a fully revised and expanded new edition based on the latest research developments in electron optics - Written by the top experts in the field - Covers every significant advance in electron optics since the subject originated - Contains exceptionally complete and carefully selected references and notes - Serves both as a reference and text

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080984169
Category : Science
Languages : en
Pages : 755

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Book Description
The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

Author: Earl J. Kirkland
Publisher: Springer Nature
ISBN: 3030332608
Category : Science
Languages : en
Pages : 357

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Book Description
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Author: Ian M. Watt
Publisher: Cambridge University Press
ISBN: 9780521435918
Category : Science
Languages : en
Pages : 506

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Book Description
The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

Author:
Publisher: Academic Press
ISBN: 0080577601
Category : Technology & Engineering
Languages : en
Pages : 425

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Book Description
Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Author: Poul Dahl
Publisher: Elsevier
ISBN: 0323160905
Category : Science
Languages : en
Pages : 156

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Book Description
Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.

Author: Max Born
Publisher: Elsevier
ISBN: 148310320X
Category : Science
Languages : en
Pages : 871

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Book Description
Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, Sixth Edition covers optical phenomenon that can be treated with Maxwell's phenomenological theory. The book is comprised of 14 chapters that discuss various topics about optics, such as geometrical theories, image forming instruments, and optics of metals and crystals. The text covers the elements of the theories of interference, interferometers, and diffraction. The book tackles several behaviors of light, including its diffraction when exposed to ultrasonic waves. The selection will be most useful to researchers whose work involves understanding the behavior of light.