Author: Kurt LeschonskiPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Preprints 1. World Congress Particle Technology. Pt. IV. Gas Cleaning, Solid-liquid-separation, Classification of Particles in Gases and Liquids
Author: Kurt LeschonskiPreprints
Author: World Congress Particle TechnologyPublisher:
ISBN:
Category :
Languages : en
Pages : 606
Book Description
1. World Congress Particle Technology
Author: 1. World Congress Particle Technology
Author: Kurt LeschonskiPublisher:
ISBN:
Category : Particles
Languages : en
Pages : 748
Book Description
Preprints
Author: K. LeschonskiPublisher:
ISBN:
Category : Particles
Languages : en
Pages : 1180
Book Description
Coal Abstracts
Author: Particles in Gases and Liquids 3
Author: K.L. MittalPublisher: Springer Science & Business Media
ISBN: 1489911871
Category : Science
Languages : en
Pages : 289
Book Description
This book documents the proceedings of the Third Symposium on Particles in Gases and Liquids: Detection, Characterization and Control held as a part of the 22nd Annual Meeting of the Fine Particle Society in San Jose, California, July 29-August 2, 1991. This series of symposia was initiated in 1987 in light of the growing importance to eliminate particles from process gases and liquids. As pointed out in the Preface to antecedent volumes in this series that particles in process gases and liquids could cause significant yield losses in precision manufacturing and concomitantly there has been heightened interest in understanding the behavior of particles in gases and liquids and devising ways to eliminate, or at least reduce substantially, these particles. The concern about particles in gases and liquids has been there for qui.te some time in the microelectronics arena, but there are other areas also where particles are of significant concern, e.g. in operation theatres in hospitals, food and beverage industry, and pharmaceutical manufacturing. This symposium basically had the same objectives as its predecessors, but to provide an update on the R&D activity taking place in the arena of particle detection, characterization and control. The printed program comprised a total of 28 papers dealing with variegated aspects of particles in gases and liquids. There were brisk and lively discussions and the attendees offered many positive comments, which goes to show that it was a well-received and needed symposium.
Particles in Gases and Liquids 2
Author: K.L. MittalPublisher: Springer Science & Business Media
ISBN: 1489935444
Category : Science
Languages : en
Pages : 393
Book Description
This book chronicles the proceedings of the Second Symposium on Particles in Gases and Liquids: Detection, Characterization and Control held as a part of the 20th Annual Fine Particle Society meeting in Boston, August 21-25, 1989. As this second symposium was as successful as the prior one, so we have decided to hold symposia on this topic on a regular (biennial) basis and the third symposium in this series is scheduled to be held at the 22nd Annual Meeting of the Fine Particle Society in San Jose, California, July 29-August 2, 1991. l As pointed out in the Preface to the prior volume in this series that recently there has been tremendous concern about yield losses due to unwanted particles, and these unwelcome particles can originate from a legion of sources, including process gases and liquids. Also all signals indicate that in the future manufacture of sophisticated and sensitive microelectronic components (with shrinking dimensions) and other precision parts, the need for detection, characterization, analysis and control of smaller and smaller particles will be more intensified.
Particles in Gases and Liquids 1
Author: K.L. MittalPublisher: Springer Science & Business Media
ISBN: 1461307937
Category : Science
Languages : en
Pages : 298
Book Description
This book documents the proceedings of the Symposium on Particles in Fluids: Detection, Characterization and Control held as a part of the 18th Fine Particle Society meeting in Boston, August 3-7, 1987. This was the Premier symposium on this topic and the response was so good that we have decided to organize it on a biennial basis and the second symposium will be held under the rubric Particles in Gases and Liquids: Detection, Characterization and Control at the 20th Fine Particle Society meeting in Boston, August 22-26, 1989. In the modern manufacture of sophisticated and sensitive microelectronic components and other precision parts, there has been a great deal of concern about yield losses due to micrometer- and submicrometer-sized particles. These particles can originate from a number of sources including fluids, i. e. , gases and liquids used in the manufacturing process. So the detection, characterization and control or removal of these undesirable particles is of cardinal importance and this symposium was conceived and o~ganized with this in mind. The purposes of this symposium were to bring together those actively involved in all aspects of particles in fluids, to provide a forum for discussion of the latest techniques for the detection, characterization and control of particles, and to highlight areas which needed intensified R&D efforts. The printed program contained a total of 46 papers and a variety of topics dealing with various ramifications of particles in fluids were presented.
Author: Kurt Leschonski