Preparation and Characterization of Hydrogenated Amorphous Silicon Thin Films and Thin Film Solar Cells Produced by Ion Plating Techniques. First Quarterly Progress Report, 1 January 1979-31 March 1979 PDF Download
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Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The development of methods for the preparation of efficient, low cost amorphous thin film solar cells involving the direct use of the ion plating technique is described. Progress is reported. (WHK).
Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The development of methods for the preparation of efficient, low cost amorphous thin film solar cells involving the direct use of the ion plating technique is described. Progress is reported. (WHK).
Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
Ion plating techniques for the preparation of hydrogenated amorphous silicon thin films have been successfully developed. The technique involves essentially the evaporation of elemental silicon through a d.c. produced hydrogen plasma. In this way hydrogen has been successfully incorporated into amorphous silicon films in concentrations as high as 30 atomic percent. Infrared spectroscopy indicates the usual SiHx stretching mode at approximately 2000 cm−1. Further evidence for the bonding of hydrogen was obtained from ESR measurement of hydrogenated and unhydrogenated samples. The measured unpaired spin density was a factor of 25 less in the hydrogenated sample. The optical absorption edges of the hydrogenated films fell in the usual range between 1.7 and 1.9 eV. Electrical conductivity measurements indicated a substantial reduction in the density of defect states in the gap as expected. It was also shown that hydrogenated amorphous silicon prepared by ion-plating could be doped by co-evaporation of the dopant element during film deposition. Both co-evaporated phosphorous and co-evaporated bismuth have been found to substantially increase the dark conductivity of a-Si:H while shifting the Fermi level towards the conduction band edge. An x-ray method for estimating the density and hydrogen content of a-Si:H has been developed. The measurement of strain in a-Si:H thin films is discussed. (WHK).
Author: Publisher: ISBN: Category : Aeronautics Languages : en Pages : 732
Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
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Author: Franklin H. Cocks