Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Advances in X-Ray Analysis PDF full book. Access full book title Advances in X-Ray Analysis by Charles Barrett. Download full books in PDF and EPUB format.
Author: Charles Barrett Publisher: Springer ISBN: 9780306381140 Category : Science Languages : en Pages : 574
Book Description
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
Author: Charles Barrett Publisher: Springer ISBN: 9780306381140 Category : Science Languages : en Pages : 574
Book Description
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
Author: N. H. Packan Publisher: ASTM International ISBN: 0803112661 Category : Materials Languages : en Pages : 679
Book Description
Annotation Effects of Radiation on Materials: Fourteenth International Symposium was presented at Andover, MA, June 1988. The symposium was sponsored by ASTM Committee E-10 on Nuclear Technology and Applications. The papers from the first three days of the symposium appear in the two volumes of this publication. Volume I encompasses radiation damage- induced microstructures; point defect, solute, and gas atom effects; atomic-level measurement techniques; and applications of theory. Volume II includes mechanical behavior, all papers dealing with pressure-vessel steels, breeder reactor components, dosimetry, and nuclear fuels. The fourth day of the symposium was devoted to the single topic of reduced-activation materials (see TK9204). The two volumes are separately sold at $127 and $128 respectively; each is independently indexed. Annotation copyrighted by Book News, Inc., Portland, OR.
Author: Bob B. He Publisher: John Wiley & Sons ISBN: 1119356067 Category : Science Languages : en Pages : 492
Book Description
An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis Two-Dimensional X-Ray Diffraction, Second Edition is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.
Author: British Steel Corporation Publisher: British Steel Corporation Market Promotion Department Specia ISBN: Category : Technology & Engineering Languages : en Pages : 408
Author: Susan Amerikaner Publisher: Disney Electronic Content ISBN: 1423146050 Category : Juvenile Fiction Languages : en Pages : 28
Book Description
t's Earth Day at the Mickey Mouse Clubhouse. Esteemed scientist Professor Von Drake is the main speaker. The Professor has a lot to say about ways we can help save our planet every single day. To the Professor's surprise, Mickey and the gang have even more to say—and show.
Author: Robert Alan Young Publisher: International Union of Crystallography ISBN: Category : Science Languages : en Pages : 316
Book Description
The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since then structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial toour understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in allbranches of science that deal with materials at the atomic level.
Author: Charles Barrett
Author: Charles Barrett
Author: N. H. Packan
Author: U.S. Atomic Energy Commission
Author: 
Author: Karl Otto Ott
Author: Bob B. He
Author: British Steel Corporation
Author: Susan Amerikaner
Author: Fulmer Research Institute
Author: Robert Alan Young