Author: William G. GuldnerPublisher:
ISBN:
Category :
Languages : en
Pages : 194
Book Description
Physical Measurement and analysis of thin films
Author: William G. GuldnerPHYSICAL MEASUREMENT AND ANALYSIS OF THIN FILMS- PRESENTED AT THE EASTERN ANALYTICAL SYMPOSIUM- PROGRESS IN ANALYTICAL CHEMISTRY
Author: Physical Measurements and Analysis of Thin Films
Author: Edward M. MurtPhysical Measurement and Analysis of Thin Films
Author: E. M. MurtPublisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 226
Book Description
Physical Measurement and Analysis of Thin Films (Progress in Analytical Chemistry, Volume 2).
Author: EM Murt (ed)Progress in Analytical Chemistry
Author: Charles Henry OrrPublisher:
ISBN:
Category : Analytical chemistry
Languages : en
Pages : 124
Book Description
Progress in Analytical Chemistry, Volume 2: Physical Measurement and Analysis of Thin Films
Author: E. M. MurtCurrent Catalog
Author: National Library of Medicine (U.S.)Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1040
Book Description
Includes subject section, name section, and 1968-1970, technical reports.
Computers in Analytical Chemistry
Author: Charles H. OrrPublisher: Springer Science & Business Media
ISBN: 1468433156
Category : Science
Languages : en
Pages : 112
Book Description
The analytical chemist is in the forefront of the race to use computers in laboratory work. The modern laboratory has a large number of instruments churning out information, and mechanized procedures for handling the huge amount of data are imperative. The marriage of instruments and computers is offered as a way of easing the burden on the scientist, as well as optimiz ing the performance of the analytical instruments. Computer systems can be applied to all the major analytical instrument procedures, and many of the leading instrument manufacturers are developing and producing systems for use in the laboratory, both for data acquisition and for control purposes. It is, therefore, timely that the session on computers in analytical chem istry of the Eastern Analytical Symposium, held in November 1968, be published in this series, which has as its aim progress in analytical chemistry. The contents are wide-ranging and include applications to mass spectrometry, X-ray spectrography, nuclear magnetic resonance spectroscopy, gas chroma tography, infrared spectrography, the use of dedicated computers, and the multiple user laboratory. Thanks are due to the authors of the papers and to the session chairmen for their efforts in the production of this very worthwhile addition to the series.
Applications of the Newer Techniques of Analysis
Author: Ivor L. SimmonsPublisher: Springer Science & Business Media
ISBN: 1468433180
Category : Science
Languages : en
Pages : 382
Book Description
This volume presents a group of selected papers given at the November, 1972, meeting of the Eastern Analytical Symposium. As has always been the intent of the series, "Progress in Analytical Chemistry," the papers are written by authorities who are also active workers in their fields. Included are applications of Raman Spectroscopy, X-Ray Diffraction, Emission Spectroscopy, Nu clear Magnetic Resonance, Liquid Chromatography, Thin-Layer Chromatography, Pyrolysis Gas Chromatography, Mass Spectrometry, Gas Chromatography and the powerful marriage of the last two. In modern analysis there is a constant search for applications of existing instrumentation in new ways to produce results hitherto unobtainable. In every case both the versatility of the researcher and the flexibility of the method used are amply illustrated. Thanks are due to the authors of the papers for their efforts in coping with the many problems of producing a manuscript in finished form enabling rapid publication. Ivor L. Simmons Galen W. Ewing v CONTENTS Raman Spectroscopy for the Study of Nematic Liquid Crystals . . . . . . 1 Bernard J. Bulkin Recent Developments in Arc Emission Spectroscopy: Introductory Remarks . . . . . . . . . . 13 Ramon M. Barnes Advances in the Static-Argon, DC-ARC Spectrochemical Source . . • . . 23 W. A. Gordon, K. M. Hambidge, and M. L. Franklin The Use of Calculated X-ray Powder Patterns in the Interpretation of Quantitative Analysis 45 C. Clark, D. K. Smith, and G. G. Johnson, Jr.