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Physical Characterization of Electronic Materials, Devices and Thin Films

Physical Characterization of Electronic Materials, Devices and Thin Films PDF Author: Edward T. Peters
Publisher:
ISBN:
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Languages : en
Pages : 44

Book Description
In support of research being carried out by the Properties and Phenomena Branch, Solid State Science Laboratory, Air Force Cambridge Research Laboratory, a service effort is being conducted that is directed toward the characterization of specified physical, chemical and structural properties of submitted specimens. Experimental methods include chemical analysis, reflection electron diffraction, X-ray diffraction and fluorescent analysis, electron probe microanalysis and light microscopy in addition to the determination of specific properties such as density, hardness and thermal conductivity. Special services such as crystal orientation, cutting, grinding and polishing are also being performed. Specific materials submitted for characterization include single crystals of calcium tartrate, cuprous chloride, cuprous bromide, lithium germanate, sodium germanate and cobalt silicide, thin film deposits of germanium, silicon carbide and arsenic on various substrate hosts and irradiated crystals of silicon and quartz. In addition, a large variety of specimens have been submitted for specific studies, such as phase identification, crystallinity and chemical analysis. (Author).
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