Author: Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages :
Book Description
Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the
Author: Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Author: Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
Author: Wilson TanPublisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780366756
Category : Technology & Engineering
Languages : en
Pages : 262
Book Description
This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Publisher:
ISBN: 9781509085309
Category : Electronic book
Languages : en
Pages : 309
Book Description
ISTFA 2014
Author: A. S. M. InternationalPublisher: ASM International
ISBN: 1627080740
Category : Technology & Engineering
Languages : en
Pages : 561
Book Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Author: Souvik MahapatraPublisher: IEEE Computer Society Press
ISBN: 9781424410149
Category : Technology & Engineering
Languages : en
Pages : 309
Book Description
Fundamentals of Electromigration-Aware Integrated Circuit Design
Author: Jens LienigPublisher: Springer
ISBN: 3319735586
Category : Technology & Engineering
Languages : en
Pages : 171
Book Description
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2007
Author: Souvik MahapatraPublisher:
ISBN: 9781424410156
Category : Integrated circuits
Languages : en
Pages : 309
Book Description
Counterfeit Integrated Circuits
Author: Mark (Mohammad) TehranipoorPublisher: Springer
ISBN: 3319118242
Category : Technology & Engineering
Languages : en
Pages : 282
Book Description
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.
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