Author: Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Physical & Failure Analysis of Integrated Circuits, International Symposium on
Author: 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017)
Author: Failure Analysis of Integrated Circuits
Author: Lawrence C. WagnerPublisher: Springer Science & Business Media
ISBN: 1461549191
Category : Technology & Engineering
Languages : en
Pages : 256
Book Description
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2019)
Author: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: IEEE StaffPublisher:
ISBN: 9781467382601
Category :
Languages : en
Pages :
Book Description
IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability, yield and performance, especially those related to advanced process technologies
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Author: IEEE StaffPublisher:
ISBN: 9781538649305
Category :
Languages : en
Pages :
Book Description
IPFA 2018 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability
Author: 
Author: 
Author: 
Author: IEEE Singapore Section