Author: Galeb Hamid MaherPublisher:
ISBN:
Category :
Languages : en
Pages : 257
Book Description
Physical and Electrical Properties of Thin Film Barium Titanate Preparted by RF Sputtering on Silicon Substrate
Author: Galeb Hamid MaherPhysical and Electrical Properties of Thin Film Barium Titanate Prepared by RF Sputtering on Silicon Substrate
Author: Galeb Hamid MaherPublisher:
ISBN:
Category : Thin film devices
Languages : en
Pages : 257
Book Description
Characteristics of Rf Sputtered Barium Titanate Films on Silicon
Author: C. A. T. SalamaPublisher:
ISBN:
Category :
Languages : en
Pages : 6
Book Description
The physical and electrical properties of barium titanate films approximately 1 micrometer thick, prepared by rf sputtering onto silicon substrates in both pure argon and 95% argon-5% oxygen glow discharges were investigated. The deposition rate, crystal structure, and refractive index of the films were investigated as a function of deposition temperature and sputtering gas. The electrical characteristics of the films, including the dielectric constant, loss tangent, conductivity, insulator bulk charge, charge storage at the BaTiO3-SiO2 interface, and ferroelectricity were also investigated. (Author).
Ferroelectrics Literature Index
Author: T. F. ConnollyPublisher: Springer Science & Business Media
ISBN: 1468462105
Category : Science
Languages : en
Pages : 713
Book Description
Research on ferroelectricity and ferroelectric materials started in 1920 with the discovery by Valasek that the variation of spontaneous polarization in Rochelle salt with sign and magnitude of an applied electric field traced a complete and reproducible hysteresis loop. Activity in the field was sporadic until 1935, when Busch and co-workers announced the observation of similar behavior in potassium dihydrogen phosphate and related compounds. Progress thereafter continued at a modest level with the undertaking of some theoretical as well as further experimental studies. In 1944, von Hippel and co-workers discovered ferroelectricity in barium titanate. The technological importance of ceramic barium titanate and other perovskites led to an upsurge of interest, with many new ferroelectrics being identified in the following decade. By 1967, about 2000 papers on various aspects of ferroelectricity had been published. The bulk of this widely dispersed literature was concerned with the experimental measurement of dielectric, crystallographic, thermal, electromechanical, elastic, optical, and magnetic properties. A critical and excellently organized cpmpilation based on these data appeared in 1969 with the publica tion of Landolt-Bornstein, Volume 111/3. This superb tabulation gave instant access to the results in the literature on nearly 450 pure substances and solid solutions of ferroelectric and antiferroelectric materials. Continuing interest in ferroelectrics, spurred by the growing importance of electrooptic crystals, resulted in the publication of almost as many additional papers by the end of 1969 as had been surveyed in Landolt-Bornstein.
Handbook of Thin Films
Author: Hari Singh NalwaPublisher: Elsevier
ISBN: 0080533248
Category : Technology & Engineering
Languages : en
Pages : 3436
Book Description
This five-volume handbook focuses on processing techniques, characterization methods, and physical properties of thin films (thin layers of insulating, conducting, or semiconductor material). The editor has composed five separate, thematic volumes on thin films of metals, semimetals, glasses, ceramics, alloys, organics, diamonds, graphites, porous materials, noncrystalline solids, supramolecules, polymers, copolymers, biopolymers, composites, blends, activated carbons, intermetallics, chalcogenides, dyes, pigments, nanostructured materials, biomaterials, inorganic/polymer composites, organoceramics, metallocenes, disordered systems, liquid crystals, quasicrystals, and layered structures.Thin films is a field of the utmost importance in today's materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices.Advanced, high-performance computers, high-definition TV, digital camcorders, sensitive broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are but a few examples of miniaturized device technologies that depend the utilization of thin film materials. The Handbook of Thin Films Materials is a comprehensive reference focusing on processing techniques, characterization methods, and physical properties of these thin film materials.
Proceedings
Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 910
Book Description
Intrinsic and Substrate Dependent Properties of Polycrystalline Barium Titanate Thin Films
Author: Kenneth Morian RingCharacterization of Solid Surfaces
Author: Philip F. KanePublisher: Springer Science & Business Media
ISBN: 1461344905
Category : Technology & Engineering
Languages : en
Pages : 675
Book Description
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.
Handbook of Thin Film Materials: Ferroelectric and dielectric thin films
Author: Hari Singh NalwaPublisher:
ISBN:
Category : Thin films
Languages : en
Pages : 678
Book Description
Catalog of Copyright Entries. Third Series
Author: Library of Congress. Copyright OfficePublisher: Copyright Office, Library of Congress
ISBN:
Category : Copyright
Languages : en
Pages : 1582
Book Description