Author: Bruce Forrest MiltonPublisher:
ISBN:
Category : Cyclotrons
Languages : en
Pages : 404
Book Description
Phase Selection in the K500 Cyclotron and the Development of a Non-linear Transfer Matrix Program
Author: Bruce Forrest MiltonPublisher:
ISBN:
Category : Cyclotrons
Languages : en
Pages : 404
Book Description
Cyclotrons And Their Applications - Proceedings Of The13th International Conference, Vancouver, 1992
Author: G DuttoPublisher: World Scientific
ISBN: 9814554200
Category :
Languages : en
Pages : 980
Book Description
This volume describes the latest developments in the design, construction and operation of cyclotrons, from compact machines producing intense beams for isotope production, cancer therapy and industrial use, to the larger versions giving higher energy beams of ions of various elements for nuclear and particle physics. Important topics include ECR ion sources, superconducting magnets and radiofrequency cavities, beam dynamics and diagnostics, beam cooling rings, control systems and various medical and industrial applications.
Phase Selection and Measurement in a Superconducting Cyclotron
Author: James Donald BaileyPublisher:
ISBN:
Category : Cyclotrons
Languages : en
Pages : 274
Book Description
Physics briefs
Author: Dissertation Abstracts International
Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 496
Book Description
INIS Atomindex
Author: Proceedings
Author: Canadiana
Author: Comprehensive Dissertation Index
Author: Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 1016
Book Description
Testing at the Speed of Light
Author: National Academies of Sciences, Engineering, and MedicinePublisher: National Academies Press
ISBN: 030947082X
Category : Science
Languages : en
Pages : 89
Book Description
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.