Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 548
Book Description
Scientific and Technical Aerospace Reports
Energy Research Abstracts
Government Reports Announcements & Index
INIS Atomindex
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X-Ray Absorption and X-Ray Emission Spectroscopy, 2 Volume Set
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
ISBN: 1118844238
Category : Science
Languages : en
Pages : 940
Book Description
X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X-ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X-ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Publisher: John Wiley & Sons
ISBN: 1118844238
Category : Science
Languages : en
Pages : 940
Book Description
X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x-ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x-ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X-ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X-ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials
Quantitative X-Ray Fluorescence Analysis
Author: Gerald R. Lachance
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 432
Book Description
A systematic account concerning the basic theory of X-ray physics and spectrometer configurations leading to simple expressions quantifying primary and secondary fluorescence emissions. Discusses the fundamental parameters approach for converting intensities to concentrations in both its classical formalism and by a number of basic influence coefficient algorithms. Examines approximations underlying influence coefficient models and theoretical simulations are used to evaluate global methods. Includes numerous detailed examples as well as extensive tabulations of theoretical data.
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 432
Book Description
A systematic account concerning the basic theory of X-ray physics and spectrometer configurations leading to simple expressions quantifying primary and secondary fluorescence emissions. Discusses the fundamental parameters approach for converting intensities to concentrations in both its classical formalism and by a number of basic influence coefficient algorithms. Examines approximations underlying influence coefficient models and theoretical simulations are used to evaluate global methods. Includes numerous detailed examples as well as extensive tabulations of theoretical data.
Laboratory EXAFS Facilities, 1980
Author: Edward A. Stern
Publisher:
ISBN:
Category : Medical
Languages : en
Pages : 184
Book Description
"Outcome of a 'Workshop on Laboratory EXAFS Facilities and Their Relation to Synchrotron Radiation Sources' held in Seattle, Washington, April 28-30, 1980"--Foreword.
Publisher:
ISBN:
Category : Medical
Languages : en
Pages : 184
Book Description
"Outcome of a 'Workshop on Laboratory EXAFS Facilities and Their Relation to Synchrotron Radiation Sources' held in Seattle, Washington, April 28-30, 1980"--Foreword.
X-Ray Microscopy II
Author: David Sayre
Publisher: Springer
ISBN: 9783662144909
Category : Technology & Engineering
Languages : en
Pages : 455
Book Description
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.
Publisher: Springer
ISBN: 9783662144909
Category : Technology & Engineering
Languages : en
Pages : 455
Book Description
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.
Handbook of Practical X-Ray Fluorescence Analysis
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.