Author: Stanford University. Computer Science Department
Publisher:
ISBN:
Category :
Languages : en
Pages : 58
Book Description
Partially Self-checking Circuits and Their Use in Performing Logical Operations
Author: Stanford University. Computer Science Department
Publisher:
ISBN:
Category :
Languages : en
Pages : 58
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 58
Book Description
Advanced Simulation and Test Methodologies for VLSI Design
Author: G. Russell
Publisher: Springer Science & Business Media
ISBN: 9780747600015
Category : Computers
Languages : en
Pages : 406
Book Description
Publisher: Springer Science & Business Media
ISBN: 9780747600015
Category : Computers
Languages : en
Pages : 406
Book Description
The State of the Art: from Device Testing to Reconfigurable Systems
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 198
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 198
Book Description
T.I.S.C.A. Technical Information Indexes
Author: United States. Naval Air Systems Command
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 122
Book Description
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 122
Book Description
Error Detecting Codes, Self-checking Circuits and Applications
Author: John F. Wakerly
Publisher: North Holland
ISBN:
Category : Business & Economics
Languages : en
Pages : 254
Book Description
Publisher: North Holland
ISBN:
Category : Business & Economics
Languages : en
Pages : 254
Book Description
Technical Information Indexes
Author:
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 126
Book Description
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 126
Book Description
Reliable Computer Systems
Author: Daniel P. Siewiorek
Publisher: CRC Press
ISBN: 1439863962
Category : Computers
Languages : en
Pages : 908
Book Description
This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Publisher: CRC Press
ISBN: 1439863962
Category : Computers
Languages : en
Pages : 908
Book Description
This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Digest of Papers
Author:
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 158
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 158
Book Description
Reliable Computer Systems
Author: Daniel Siewiorek
Publisher: Digital Press
ISBN: 1483297438
Category : Computers
Languages : en
Pages : 929
Book Description
Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Publisher: Digital Press
ISBN: 1483297438
Category : Computers
Languages : en
Pages : 929
Book Description
Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Principles of Self Checking Processor Design and an Example
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
Book Description
A self-checking processor has redundant hardware to insure that no likely failure can cause undetected errors and all likely failures are detected in normal operation. We show how error-detecting codes and self-checking circuits can be used to achieve these properties in a microprogrammed processor. The choice of error-detecting codes and the placement of checkers to monitor coded data paths are discussed. The use of codes to detect errors in arithmetic and logic operations and microprogram control units is described. An example processor design is given and some observations on the diagnosis and repair of such a processor are made. From the example design it appears that somewhat less than 50% overall redundancy is required to guarantee the detection of all failures that affect a single medium- or large-scale integration circuit package.
Publisher:
ISBN:
Category :
Languages : en
Pages : 72
Book Description
A self-checking processor has redundant hardware to insure that no likely failure can cause undetected errors and all likely failures are detected in normal operation. We show how error-detecting codes and self-checking circuits can be used to achieve these properties in a microprogrammed processor. The choice of error-detecting codes and the placement of checkers to monitor coded data paths are discussed. The use of codes to detect errors in arithmetic and logic operations and microprogram control units is described. An example processor design is given and some observations on the diagnosis and repair of such a processor are made. From the example design it appears that somewhat less than 50% overall redundancy is required to guarantee the detection of all failures that affect a single medium- or large-scale integration circuit package.