Author: Ralf Rauer
Publisher: Cuvillier Verlag
ISBN: 3865376681
Category :
Languages : en
Pages : 131
Book Description
Optical Spectroscopy of Strongly Correlated Transition-metal Oxides
Author: Ralf Rauer
Publisher: Cuvillier Verlag
ISBN: 3865376681
Category :
Languages : en
Pages : 131
Book Description
Publisher: Cuvillier Verlag
ISBN: 3865376681
Category :
Languages : en
Pages : 131
Book Description
Optical Spectroscopy of Strongly Correlated Transition-Metal Oxides
Author: Ralf Rauer
Publisher: Cuvillier Verlag
ISBN: 373691668X
Category : Science
Languages : en
Pages : 129
Book Description
Publisher: Cuvillier Verlag
ISBN: 373691668X
Category : Science
Languages : en
Pages : 129
Book Description
Strongly Correlated Systems
Author: Adolfo Avella
Publisher: Springer
ISBN: 3662441330
Category : Science
Languages : en
Pages : 329
Book Description
The continuous evolution and development of experimental techniques is at the basis of any fundamental achievement in modern physics. Strongly correlated systems (SCS), more than any other, need to be investigated through the greatest variety of experimental techniques in order to unveil and crosscheck the numerous and puzzling anomalous behaviors characterizing them. The study of SCS fostered the improvement of many old experimental techniques, but also the advent of many new ones just invented in order to analyze the complex behaviors of these systems. Many novel materials, with functional properties emerging from macroscopic quantum behaviors at the frontier of modern research in physics, chemistry and materials science, belong to this class of systems. The volume presents a representative collection of the modern experimental techniques specifically tailored for the analysis of strongly correlated systems. Any technique is presented in great detail by its own inventor or by one of the world-wide recognized main contributors. The exposition has a clear pedagogical cut and fully reports on the most relevant case study where the specific technique showed to be very successful in describing and enlightening the puzzling physics of a particular strongly correlated system. The book is intended for advanced graduate students and post-docs in the field as textbook and/or main reference, but also for any other researcher in the field who appreciates consulting a single, but comprehensive, source or wishes to get acquainted, in a as painless as possible way, with the working details of a specific technique.
Publisher: Springer
ISBN: 3662441330
Category : Science
Languages : en
Pages : 329
Book Description
The continuous evolution and development of experimental techniques is at the basis of any fundamental achievement in modern physics. Strongly correlated systems (SCS), more than any other, need to be investigated through the greatest variety of experimental techniques in order to unveil and crosscheck the numerous and puzzling anomalous behaviors characterizing them. The study of SCS fostered the improvement of many old experimental techniques, but also the advent of many new ones just invented in order to analyze the complex behaviors of these systems. Many novel materials, with functional properties emerging from macroscopic quantum behaviors at the frontier of modern research in physics, chemistry and materials science, belong to this class of systems. The volume presents a representative collection of the modern experimental techniques specifically tailored for the analysis of strongly correlated systems. Any technique is presented in great detail by its own inventor or by one of the world-wide recognized main contributors. The exposition has a clear pedagogical cut and fully reports on the most relevant case study where the specific technique showed to be very successful in describing and enlightening the puzzling physics of a particular strongly correlated system. The book is intended for advanced graduate students and post-docs in the field as textbook and/or main reference, but also for any other researcher in the field who appreciates consulting a single, but comprehensive, source or wishes to get acquainted, in a as painless as possible way, with the working details of a specific technique.
Spectroscopy of Mott Insulators and Correlated Metals
Author: Atsushi Fujimori
Publisher: Springer Science & Business Media
ISBN: 3642578349
Category : Technology & Engineering
Languages : en
Pages : 272
Book Description
Extensive studies of high-Tc cuprate superconductors have stimualted investigations into various transition-metal oxides. Mott transitions in particular provide fascinating problems and new concepts in condensed matter physics. This book is a collection of overviews by well-known, active researchers in this field. It deals with the latest developments, with particular emphasis on the theoretical, spectroscopic, and transport aspects.
Publisher: Springer Science & Business Media
ISBN: 3642578349
Category : Technology & Engineering
Languages : en
Pages : 272
Book Description
Extensive studies of high-Tc cuprate superconductors have stimualted investigations into various transition-metal oxides. Mott transitions in particular provide fascinating problems and new concepts in condensed matter physics. This book is a collection of overviews by well-known, active researchers in this field. It deals with the latest developments, with particular emphasis on the theoretical, spectroscopic, and transport aspects.
Photoelectron Spectroscopy
Author: Shigemasa Suga
Publisher: Springer Nature
ISBN: 3030640736
Category : Science
Languages : en
Pages : 511
Book Description
This book presents photoelectron spectroscopy as a valuable method for studying the electronic structures of various solid materials in the bulk state, on surfaces, and at buried interfaces. This second edition introduces the advanced technique of high-resolution and high-efficiency spin- and momentum-resolved photoelectron spectroscopy using a novel momentum microscope, enabling high-precision measurements down to a length scale of some tens of nanometers. The book also deals with fundamental concepts and approaches to applying this and other complementary techniques, such as inverse photoemission, photoelectron diffraction, scanning tunneling spectroscopy, as well as photon spectroscopy based on (soft) x-ray absorption and resonance inelastic (soft) x-ray scattering. This book is the ideal tool to expand readers’ understanding of this marvelously versatile experimental method, as well as the electronic structures of metals and insulators.
Publisher: Springer Nature
ISBN: 3030640736
Category : Science
Languages : en
Pages : 511
Book Description
This book presents photoelectron spectroscopy as a valuable method for studying the electronic structures of various solid materials in the bulk state, on surfaces, and at buried interfaces. This second edition introduces the advanced technique of high-resolution and high-efficiency spin- and momentum-resolved photoelectron spectroscopy using a novel momentum microscope, enabling high-precision measurements down to a length scale of some tens of nanometers. The book also deals with fundamental concepts and approaches to applying this and other complementary techniques, such as inverse photoemission, photoelectron diffraction, scanning tunneling spectroscopy, as well as photon spectroscopy based on (soft) x-ray absorption and resonance inelastic (soft) x-ray scattering. This book is the ideal tool to expand readers’ understanding of this marvelously versatile experimental method, as well as the electronic structures of metals and insulators.
Encyclopedia of Modern Optics
Author: Bob D. Guenther
Publisher: Academic Press
ISBN: 0128149825
Category : Technology & Engineering
Languages : en
Pages : 2253
Book Description
The Encyclopedia of Modern Optics, Second Edition, Five Volume Set provides a wide-ranging overview of the field, comprising authoritative reference articles for undergraduate and postgraduate students and those researching outside their area of expertise. Topics covered include classical and quantum optics, lasers, optical fibers and optical fiber systems, optical materials and light-emitting diodes (LEDs). Articles cover all subfields of optical physics and engineering, such as electro-optical design of modulators and detectors. This update contains contributions from international experts who discuss topics such as nano-photonics and plasmonics, optical interconnects, photonic crystals and 2D materials, such as graphene or holy fibers. Other topics of note include solar energy, high efficiency LED’s and their use in illumination, orbital angular momentum, quantum optics and information, metamaterials and transformation optics, high power fiber and UV fiber lasers, random lasers and bio-imaging. Addresses recent developments in the field and integrates concepts from fundamental physics with applications for manufacturing and engineering/design Provides a broad and interdisciplinary coverage of specialist areas Ensures that the material is appropriate for new researchers and those working in a new sub-field, as well as those in industry Thematically arranged and alphabetically indexed, with cross-references added to facilitate ease-of-use
Publisher: Academic Press
ISBN: 0128149825
Category : Technology & Engineering
Languages : en
Pages : 2253
Book Description
The Encyclopedia of Modern Optics, Second Edition, Five Volume Set provides a wide-ranging overview of the field, comprising authoritative reference articles for undergraduate and postgraduate students and those researching outside their area of expertise. Topics covered include classical and quantum optics, lasers, optical fibers and optical fiber systems, optical materials and light-emitting diodes (LEDs). Articles cover all subfields of optical physics and engineering, such as electro-optical design of modulators and detectors. This update contains contributions from international experts who discuss topics such as nano-photonics and plasmonics, optical interconnects, photonic crystals and 2D materials, such as graphene or holy fibers. Other topics of note include solar energy, high efficiency LED’s and their use in illumination, orbital angular momentum, quantum optics and information, metamaterials and transformation optics, high power fiber and UV fiber lasers, random lasers and bio-imaging. Addresses recent developments in the field and integrates concepts from fundamental physics with applications for manufacturing and engineering/design Provides a broad and interdisciplinary coverage of specialist areas Ensures that the material is appropriate for new researchers and those working in a new sub-field, as well as those in industry Thematically arranged and alphabetically indexed, with cross-references added to facilitate ease-of-use
Epitaxial Growth of Complex Metal Oxides
Author: Gertjan Koster
Publisher: Elsevier
ISBN: 1782422552
Category : Technology & Engineering
Languages : en
Pages : 505
Book Description
The atomic arrangement and subsequent properties of a material are determined by the type and conditions of growth leading to epitaxy, making control of these conditions key to the fabrication of higher quality materials. Epitaxial Growth of Complex Metal Oxides reviews the techniques involved in such processes and highlights recent developments in fabrication quality which are facilitating advances in applications for electronic, magnetic and optical purposes. Part One reviews the key techniques involved in the epitaxial growth of complex metal oxides, including growth studies using reflection high-energy electron diffraction, pulsed laser deposition, hybrid molecular beam epitaxy, sputtering processes and chemical solution deposition techniques for the growth of oxide thin films. Part Two goes on to explore the effects of strain and stoichiometry on crystal structure and related properties, in thin film oxides. Finally, the book concludes by discussing selected examples of important applications of complex metal oxide thin films in Part Three. - Provides valuable information on the improvements in epitaxial growth processes that have resulted in higher quality films of complex metal oxides and further advances in applications for electronic and optical purposes - Examines the techniques used in epitaxial thin film growth - Describes the epitaxial growth and functional properties of complex metal oxides and explores the effects of strain and defects
Publisher: Elsevier
ISBN: 1782422552
Category : Technology & Engineering
Languages : en
Pages : 505
Book Description
The atomic arrangement and subsequent properties of a material are determined by the type and conditions of growth leading to epitaxy, making control of these conditions key to the fabrication of higher quality materials. Epitaxial Growth of Complex Metal Oxides reviews the techniques involved in such processes and highlights recent developments in fabrication quality which are facilitating advances in applications for electronic, magnetic and optical purposes. Part One reviews the key techniques involved in the epitaxial growth of complex metal oxides, including growth studies using reflection high-energy electron diffraction, pulsed laser deposition, hybrid molecular beam epitaxy, sputtering processes and chemical solution deposition techniques for the growth of oxide thin films. Part Two goes on to explore the effects of strain and stoichiometry on crystal structure and related properties, in thin film oxides. Finally, the book concludes by discussing selected examples of important applications of complex metal oxide thin films in Part Three. - Provides valuable information on the improvements in epitaxial growth processes that have resulted in higher quality films of complex metal oxides and further advances in applications for electronic and optical purposes - Examines the techniques used in epitaxial thin film growth - Describes the epitaxial growth and functional properties of complex metal oxides and explores the effects of strain and defects
Electronic and Magnetic Properties of Pure and Structured Cuprate Superconductors
Author:
Publisher: Cuvillier Verlag
ISBN: 3865370810
Category :
Languages : en
Pages : 105
Book Description
Publisher: Cuvillier Verlag
ISBN: 3865370810
Category :
Languages : en
Pages : 105
Book Description
In Situ Characterization of Thin Film Growth
Author: Gertjan Koster
Publisher: Elsevier
ISBN: 0857094955
Category : Technology & Engineering
Languages : en
Pages : 295
Book Description
Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques
Publisher: Elsevier
ISBN: 0857094955
Category : Technology & Engineering
Languages : en
Pages : 295
Book Description
Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research.Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth.With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. - Chapters review electron diffraction techniques, including the methodology for observations and measurements - Discusses the principles and applications of photoemission techniques - Examines alternative in situ characterisation techniques
Spectroscopy of Complex Oxide Interfaces
Author: Claudia Cancellieri
Publisher: Springer
ISBN: 3319749897
Category : Technology & Engineering
Languages : en
Pages : 326
Book Description
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.
Publisher: Springer
ISBN: 3319749897
Category : Technology & Engineering
Languages : en
Pages : 326
Book Description
This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.