Author: Franz Mayinger
Publisher: Springer Science & Business Media
ISBN: 3662029677
Category : Science
Languages : en
Pages : 462
Book Description
Increasing possibilities of computer-aided data processing have caused a new revival of optical techniques in many areas of mechanical and chemical en gineering. Optical methods have a long tradition in heat and mass transfer and in fluid dynamics. Global experimental information is not sufficient for developing constitution equations to describe complicated phenomena in fluid dynamics or in transfer processes by a computer program . Furthermore, a detailed insight with high local and temporal resolution into the thermo-and fluiddynamic situations is necessary. Sets of equations for computer program in thermo dynamics and fluid dynamics usually consist of two types of formulations: a first one derived from the conservation laws for mass, energy and momentum, and a second one mathematically modelling transport processes like laminar or turbulent diffusion. For reliably predicting the heat transfer, for example, the velocity and temperature field in the boundary layer must be known, or a physically realistic and widely valid correlation describing the turbulence must be avail able. For a better understanding of combustion processes it is necessary to know the local concentration and temperature just ahead of the flame and in the ignition zone.
Optical Measurements
Author: Franz Mayinger
Publisher: Springer Science & Business Media
ISBN: 3662029677
Category : Science
Languages : en
Pages : 462
Book Description
Increasing possibilities of computer-aided data processing have caused a new revival of optical techniques in many areas of mechanical and chemical en gineering. Optical methods have a long tradition in heat and mass transfer and in fluid dynamics. Global experimental information is not sufficient for developing constitution equations to describe complicated phenomena in fluid dynamics or in transfer processes by a computer program . Furthermore, a detailed insight with high local and temporal resolution into the thermo-and fluiddynamic situations is necessary. Sets of equations for computer program in thermo dynamics and fluid dynamics usually consist of two types of formulations: a first one derived from the conservation laws for mass, energy and momentum, and a second one mathematically modelling transport processes like laminar or turbulent diffusion. For reliably predicting the heat transfer, for example, the velocity and temperature field in the boundary layer must be known, or a physically realistic and widely valid correlation describing the turbulence must be avail able. For a better understanding of combustion processes it is necessary to know the local concentration and temperature just ahead of the flame and in the ignition zone.
Publisher: Springer Science & Business Media
ISBN: 3662029677
Category : Science
Languages : en
Pages : 462
Book Description
Increasing possibilities of computer-aided data processing have caused a new revival of optical techniques in many areas of mechanical and chemical en gineering. Optical methods have a long tradition in heat and mass transfer and in fluid dynamics. Global experimental information is not sufficient for developing constitution equations to describe complicated phenomena in fluid dynamics or in transfer processes by a computer program . Furthermore, a detailed insight with high local and temporal resolution into the thermo-and fluiddynamic situations is necessary. Sets of equations for computer program in thermo dynamics and fluid dynamics usually consist of two types of formulations: a first one derived from the conservation laws for mass, energy and momentum, and a second one mathematically modelling transport processes like laminar or turbulent diffusion. For reliably predicting the heat transfer, for example, the velocity and temperature field in the boundary layer must be known, or a physically realistic and widely valid correlation describing the turbulence must be avail able. For a better understanding of combustion processes it is necessary to know the local concentration and temperature just ahead of the flame and in the ignition zone.
Optical Measurements for Scientists and Engineers
Author: Arthur McClelland
Publisher: Cambridge University Press
ISBN: 1107173019
Category : Science
Languages : en
Pages : 321
Book Description
An accessible, introductory text explaining how to select, set up and use optical spectroscopy and optical microscopy techniques.
Publisher: Cambridge University Press
ISBN: 1107173019
Category : Science
Languages : en
Pages : 321
Book Description
An accessible, introductory text explaining how to select, set up and use optical spectroscopy and optical microscopy techniques.
Optical Measurement of Surface Topography
Author: Richard Leach
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Publisher: Springer Science & Business Media
ISBN: 3642120121
Category : Technology & Engineering
Languages : en
Pages : 333
Book Description
The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
Electromagnetic Noise and Quantum Optical Measurements
Author: Hermann A. Haus
Publisher: Springer Science & Business Media
ISBN: 3662041901
Category : Science
Languages : en
Pages : 572
Book Description
From the reviews: "Haus’ book provides numerous insights on topics of wide importance, and contains much material not available elsewhere in book form. [...] an indispensable resource for those working in quantum optics or electronics." Optics & Photonics News
Publisher: Springer Science & Business Media
ISBN: 3662041901
Category : Science
Languages : en
Pages : 572
Book Description
From the reviews: "Haus’ book provides numerous insights on topics of wide importance, and contains much material not available elsewhere in book form. [...] an indispensable resource for those working in quantum optics or electronics." Optics & Photonics News
Optical Scattering
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Digital Optical Measurement Techniques and Applications
Author: Pramod Rastogi
Publisher: Artech House
ISBN: 1608078078
Category : Technology & Engineering
Languages : en
Pages : 473
Book Description
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Publisher: Artech House
ISBN: 1608078078
Category : Technology & Engineering
Languages : en
Pages : 473
Book Description
This new resource explains the principles and applications of today’s digital optical measurement techniques. From start to finish, each chapter provides a concise introduction to the concepts and principles of digital optical metrology, followed by a detailed presentation of their applications. The development of all these topics, including their numerous methods, principles, and applications, has been illustrated using a large number of easy-to-understand figures. This book aims to not only help the reader identify the appropriate techniques in function of the measurement requirements, but also assess modern digital measurement systems.
Fast Electrical and Optical Measurements
Author: D.J. Thompson
Publisher: Springer Science & Business Media
ISBN: 9401704457
Category : Technology & Engineering
Languages : en
Pages : 1065
Book Description
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
Publisher: Springer Science & Business Media
ISBN: 9401704457
Category : Technology & Engineering
Languages : en
Pages : 1065
Book Description
An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas urements, includes Sections (5) through (9).
Handbook of Dimensional Measurement
Author: Francis T. Farago
Publisher: Industrial Press Inc.
ISBN: 9780831130534
Category : Education
Languages : en
Pages : 608
Book Description
Nineteen Fact-Filled Charters that contain authoritative treatment of all aspects of dimensional measurement technology make Handbook of Dimensional Measurement the most readable and comprehensive guide available for engineers and technicians engages in the various stages of industrial production. Design engineers, manufacturing engineers, tool and gage makers, quality control specialists, and reliability experts will find a wealth of practical data as well as complete coverage - both basic and advanced - of dimensional measurement techniques and equipment. The Third Edition of this classic book has been completely revised to include the computer and electronics revolution in metrology. Virtually every type of measurement instrument and machine, even the newest devices, can be found in these pages. Hundreds of changes, and additions and scores of new illustrations have been incorporated to assure that Handbook of Dimensional Measurement retains its status as the standard reference for the practitioner of dimensional measurement.
Publisher: Industrial Press Inc.
ISBN: 9780831130534
Category : Education
Languages : en
Pages : 608
Book Description
Nineteen Fact-Filled Charters that contain authoritative treatment of all aspects of dimensional measurement technology make Handbook of Dimensional Measurement the most readable and comprehensive guide available for engineers and technicians engages in the various stages of industrial production. Design engineers, manufacturing engineers, tool and gage makers, quality control specialists, and reliability experts will find a wealth of practical data as well as complete coverage - both basic and advanced - of dimensional measurement techniques and equipment. The Third Edition of this classic book has been completely revised to include the computer and electronics revolution in metrology. Virtually every type of measurement instrument and machine, even the newest devices, can be found in these pages. Hundreds of changes, and additions and scores of new illustrations have been incorporated to assure that Handbook of Dimensional Measurement retains its status as the standard reference for the practitioner of dimensional measurement.
Photodetection and Measurement
Author: Mark Johnson
Publisher: McGraw Hill Professional
ISBN: 0071433481
Category : Technology & Engineering
Languages : en
Pages : 316
Book Description
MAKE OPTICAL MEASUREMENTS WITH MAXIMUM ACCURACY AND MINIMUM COST The "opto-electronics revolution" has made the art and science of making sensitive, accurate, and inexpensive optical measurements must-know information for legions of electronic engineers and research students. And there’s no faster or easier way to master photodetection and measurement techniques than with this hands-on tutorial written by a teacher with experience enough to know the questions you would ask. A clear, easy-to-understand "rules-of-thumb" approach shows you how to make high-performance optical measurements by getting the fundamentals right, often with simple, inexpensive equipment commonly found in laboratories. It includes treatment of: * Photodetectors * Amplifiers * LED sources * Electronic modulation and demodulation * Interference avoidance * Data acquisition and basic DSP You’ll also gain a firm understanding of noise-reduction techniques and the essentials of building-in speed, sensitivity,and stability. If you want to learn the secret of making sound optical measurements without expensive equipment, this is the one resource you shouldn’t work without.
Publisher: McGraw Hill Professional
ISBN: 0071433481
Category : Technology & Engineering
Languages : en
Pages : 316
Book Description
MAKE OPTICAL MEASUREMENTS WITH MAXIMUM ACCURACY AND MINIMUM COST The "opto-electronics revolution" has made the art and science of making sensitive, accurate, and inexpensive optical measurements must-know information for legions of electronic engineers and research students. And there’s no faster or easier way to master photodetection and measurement techniques than with this hands-on tutorial written by a teacher with experience enough to know the questions you would ask. A clear, easy-to-understand "rules-of-thumb" approach shows you how to make high-performance optical measurements by getting the fundamentals right, often with simple, inexpensive equipment commonly found in laboratories. It includes treatment of: * Photodetectors * Amplifiers * LED sources * Electronic modulation and demodulation * Interference avoidance * Data acquisition and basic DSP You’ll also gain a firm understanding of noise-reduction techniques and the essentials of building-in speed, sensitivity,and stability. If you want to learn the secret of making sound optical measurements without expensive equipment, this is the one resource you shouldn’t work without.
Spectrophotometry
Author:
Publisher: Elsevier
ISBN: 0123860237
Category : Technology & Engineering
Languages : en
Pages : 560
Book Description
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications. - Written by the leading international experts from industry, government, and academia - Written as a handbook, with in depth discussion of the topics - Focus on making the most accurate and reproducible measurements - Many practical applications and examples
Publisher: Elsevier
ISBN: 0123860237
Category : Technology & Engineering
Languages : en
Pages : 560
Book Description
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications. - Written by the leading international experts from industry, government, and academia - Written as a handbook, with in depth discussion of the topics - Focus on making the most accurate and reproducible measurements - Many practical applications and examples