Author: C. ChenPublisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
On Fault Simulation of Digital Circuits by Critical Path Tracking
Author: C. ChenFault Simulation of Combinational Circuits Based on Critical Path Tracing
Author: Charles James BurnettPublisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 246
Book Description
Fault Simulation by Improved Critical Path Tracing
Author: Anindya SenPublisher:
ISBN:
Category : Critical path analysis
Languages : en
Pages : 274
Book Description
Fast Fault Simulation and Compact Test Generation
Author: T. RamakrishnanExtensive strategies for critical path tracing (ESCRIPT) techniques for fault simulation
Author: Jong-Kwon ChangPublisher:
ISBN:
Category : Critical path analysis
Languages : en
Pages : 244
Book Description
Testing of Digital Systems
Author: N. K. JhaPublisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Modeling and Diagnosis of Cell Type Faults in Digital Circuits
Author: Iwao YamazakiBritish Reports, Translations and Theses
Author: British Library. Document Supply CentrePublisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 708
Book Description
Fault Diagnosis of Digital Systems
Author: Herbert Y. ChangPublisher: Krieger Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 186
Book Description
Science Abstracts
Author: Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 980
Book Description