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Author: Brian Poling Publisher: ISBN: Category : Automatic test equipment Languages : en Pages : 121
Book Description
Built-In Self-Test (BIST) is a method of designing and creating an electronic chip or an electronic system that can self test for correct functionality and ensure no manufacturing defects. The reason for analog BIST is the testing of analog parts of analog and mixed-signal ICs is a costly process that traditionally requires the use of expensive high-end automatic test equipment. Due to the nature of the testing and length of the testing process, an efficient analog BIST scheme is in high demand for the ever increasing complexity of analog and mixed-signal circuits. This thesis presents a BIST scheme for generation and response waveform extraction that allows the detection of a faulty circuit design. Along with the detection, an approach to test high speed analog and mixed-signal circuits with test signals upwards of 1GHz is presented. A practical application is to test analog or mixed-signal IC that has a wide bandwidth ADC in its front-end. The BIST scheme includes a method to store the test signal and generate it for the circuit to be tested along with a way to extract the response test signal from multiple test points and allow fault detection. Along with this research, a stepping stone is implemented for analog modeling using MATLAB for accuracy and speed of circuit simulations. The problems associated with the BIST scheme and analog modeling is discussed, along with recommendations.
Author: Brian Poling Publisher: ISBN: Category : Automatic test equipment Languages : en Pages : 121
Book Description
Built-In Self-Test (BIST) is a method of designing and creating an electronic chip or an electronic system that can self test for correct functionality and ensure no manufacturing defects. The reason for analog BIST is the testing of analog parts of analog and mixed-signal ICs is a costly process that traditionally requires the use of expensive high-end automatic test equipment. Due to the nature of the testing and length of the testing process, an efficient analog BIST scheme is in high demand for the ever increasing complexity of analog and mixed-signal circuits. This thesis presents a BIST scheme for generation and response waveform extraction that allows the detection of a faulty circuit design. Along with the detection, an approach to test high speed analog and mixed-signal circuits with test signals upwards of 1GHz is presented. A practical application is to test analog or mixed-signal IC that has a wide bandwidth ADC in its front-end. The BIST scheme includes a method to store the test signal and generate it for the circuit to be tested along with a way to extract the response test signal from multiple test points and allow fault detection. Along with this research, a stepping stone is implemented for analog modeling using MATLAB for accuracy and speed of circuit simulations. The problems associated with the BIST scheme and analog modeling is discussed, along with recommendations.
Author: Gordon W. Roberts Publisher: Springer Science & Business Media ISBN: 1461523419 Category : Technology & Engineering Languages : en Pages : 125
Book Description
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
Author: Charles E. Stroud Publisher: ISBN: Category : Analog computer simultion Languages : en Pages : 0
Book Description
A Built-In Self-Test architecture was developed for testing analog circuits in mixed-signal systems. The Built-In Self-Test circuitry primarily resides in the digital portion of the mixed-signal system in order to minimize performance impact on the analog circuitry. The test pattern generation portion of the Built-In Self-Test circuitry produces a number of different test waveforms found to be effective in detecting faults in the analog circuitry. The output response analysis function consists of a double-precision accumulator that facilitates determination of the faulty/fault-free status of an analog circuit with acceptable component parameter variations. Ten benchmark circuits were established for the evaluation of analog testing approaches along with acceptable component parameter variations and a standard set of faults and fault models for each benchmark circuit. Finally, an equation was developed for the calculation of analog fault coverage that takes into consideration the probability of potential detection of faults due to component parameter variation. Evaluation of the Built-In Self-Test architecture via analog fault simulation using the benchmark circuits and the fault coverage equation indicates that the approach is effective in detecting catastrophe and parametric faults in a wide variety of analog circuits.
Author: Publisher: IEEE Computer Society Press ISBN: Category : Computers Languages : en Pages : 464
Book Description
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on test generation, on-line testing, analog and mixed si
Author: Gordon W. Roberts Publisher: ISBN: 9780199796212 Category : Integrated circuits Languages : en Pages : 0
Book Description
With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.
Author: Bapiraju Vinnakota Publisher: ISBN: Category : Technology & Engineering Languages : en Pages : 296
Book Description
More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.
Author: Brian Poling
Author: Brian Poling
Author: Gordon W. Roberts
Author: Charles E. Stroud
Author: Charles E. Stroud
Author: 
Author: 
Author: Gordon W. Roberts
Author: 
Author: Institute of Electrical and Electronics Engineers
Author: Bapiraju Vinnakota