Author: Roger P. NetterfieldPublisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 42
Book Description
OLE (on-line Ellipsometer)
Author: Roger P. NetterfieldPublisher:
ISBN:
Category : Ellipsometry
Languages : en
Pages : 42
Book Description
Ellipsometry
Author: Faustino WahaiaPublisher: BoD – Books on Demand
ISBN: 9535136232
Category : Technology & Engineering
Languages : en
Pages : 164
Book Description
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
Mueller matrix ellipsometry studies of nanostructured materials
Author: Roger MagnussonPublisher: Linköping University Electronic Press
ISBN: 9175192004
Category : Ellipsometry
Languages : en
Pages : 58
Book Description
Materials can be tailored on the nano-scale to show properties that cannot be found in bulk materials. Often these properties reveal themselves when electromagnetic radiation, e.g. light, interacts with the material. Numerous examples of such types of materials are found in nature. There are for example many insects and birds with exoskeletons or feathers that reflect light in special ways. Of special interest in this work is the scarab beetle Cetonia aurata which has served as inspiration to develop advanced nanostructures due to its ability to turn unpolarized light into almost completely circularly polarized light. The objectives of this thesis are to design and characterize bioinspired nanostructures and to develop optical methodology for their analysis. Mueller-matrix ellipsometry has been used to extract optical and structural properties of nanostructured materials. Mueller-matrix ellipsometry is an excellent tool for studying the interaction between nanostructures and light. It is a non-destructive method and provides a complete description of the polarizing properties of a sample and allows for determination of structural parameters. Three types of nanostructures have been studied. The rst is an array of carbon nanobers grown on a conducting substrate. Detailed information on physical symmetries and band structure of the material were determined. Furthermore, changes in its optical properties when the individual nanobers were electromechanically bent to alter the periodicity of the photonic crystal were studied. The second type of nanostructure studied is bioinspired lms with nanospirals of InxAl1–xN which reflect light with a high degree of circular polarization in a narrow spectral band. These nanostructures were grown under controlled conditions to form columnar structures with an internally graded refractive index responsible for the ability to reflect circularly polarized light. Finally, angle-dependent Mueller matrices were recorded of natural nanostructures in C. aurata with the objective to refine the methodology for structural analysis. A Cloude sum decomposition was applied and a more stable regression-based decomposition was developed for deepened analysis of these depolarizing Mueller matrices. It was found that reflection at near-normal incidence from C. aurata can be described as a sum reflection o a mirror and a left-handed circular polarizer. At oblique incidence the description becomes more complex and involves additional optical components.
Advances in Polarimetry and Ellipsometry: Fundamentals and Applications
Author: Haofeng HuPublisher: Frontiers Media SA
ISBN: 283250261X
Category : Science
Languages : en
Pages : 165
Book Description
Ellipsometry at the Nanoscale
Author: Maria LosurdoPublisher: Springer Science & Business Media
ISBN: 3642339565
Category : Technology & Engineering
Languages : en
Pages : 740
Book Description
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Spectroscopic Ellipsometry
Author: Hiroyuki FujiwaraPublisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Handbook of Ellipsometry
Author: Harland TompkinsPublisher: William Andrew
ISBN: 0815517475
Category : Science
Languages : en
Pages : 887
Book Description
The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale. With the acceleration of new instruments and applications now occurring, this book provides an essential foundation for the current science and technology of ellipsometry for scientists and engineers in industry and academia at the forefront of nanotechnology developments in instrumentation, integrated circuits, biotechnology, and pharmaceuticals. Divided into four parts, this comprehensive handbook covers the theory of ellipsometry, instrumentation, applications, and emerging areas. Experts in the field contributed to its twelve chapters, covering various aspects of ellipsometry.
Spectroscopic Ellipsometry for Photovoltaics
Author: Hiroyuki FujiwaraPublisher: Springer
ISBN: 3319753770
Category : Science
Languages : en
Pages : 602
Book Description
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Spectroscopic Ellipsometry
Author: Harland G. TompkinsPublisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
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