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Nomographs for Use in the Fabrication and Testing of Ge (Li) Detectors

Nomographs for Use in the Fabrication and Testing of Ge (Li) Detectors PDF Author: Alvin H. Sher
Publisher:
ISBN:
Category : Gamma rays
Languages : en
Pages : 24

Book Description
Six nomographs which can facilitate the fabrication and testing of lithium-drifted germanium gamma-ray detectors (Ge(Li) detectors) have been constructed which relate the following parameters:time, temperature, applied bias, and drifted depth:lithium mobility, crystal resistivity, and oxygen concentration; area, capacitance, and drifted depth for planar Ge(Li) detectors; drifted depth, length, and capacitance for coaxial Ge(Li) detectors; total spectral resolution; system noise, and detector resolution; gamma-ray energy, and effective Fano factor.The use of these nomographs is described and illustrative examples are given.(Author).

Nomographs for Use in the Fabrication and Testing of Ge (Li) Detectors

Nomographs for Use in the Fabrication and Testing of Ge (Li) Detectors PDF Author: Alvin H. Sher
Publisher:
ISBN:
Category : Gamma rays
Languages : en
Pages : 24

Book Description
Six nomographs which can facilitate the fabrication and testing of lithium-drifted germanium gamma-ray detectors (Ge(Li) detectors) have been constructed which relate the following parameters:time, temperature, applied bias, and drifted depth:lithium mobility, crystal resistivity, and oxygen concentration; area, capacitance, and drifted depth for planar Ge(Li) detectors; drifted depth, length, and capacitance for coaxial Ge(Li) detectors; total spectral resolution; system noise, and detector resolution; gamma-ray energy, and effective Fano factor.The use of these nomographs is described and illustrative examples are given.(Author).

Lithium-Drifted Germanium Detectors: Their Fabrication and Use

Lithium-Drifted Germanium Detectors: Their Fabrication and Use PDF Author: I. C. Brownridge
Publisher: Springer Science & Business Media
ISBN: 1461345987
Category : Technology & Engineering
Languages : en
Pages : 222

Book Description
A lithium-drifted germanium detector is a semiconductor de vice which operates at liquid nitrogen temperature, and is used for detection of nuclear radiation, mostly gamma ray. The detection occurs when the y-ray undergoes an interaction in the intrinsic or I region of the semiconductor. The interaction results in the pro duction of charge carriers which are swept out by an electric field. This is accomplished by reverse biasing the detector with approxi mately 100 v/mm of intrinsic material. The total amount of charge swept out is proportional to the energy dissipated in the intrinsic region. This may include the total energy of the photon, but gen erally somewhat less. The Ge(Li) device is a semiconductor p-n device with a very large intrinsic region between the positive carrier region and the negative carrier region (P-I-N). The fabrication of this device consists of three major steps: the diffusion of the lithium into the p-type germanium to give an n-type surface region, the drifting process to obtain the intrinsic region as deeply as possible, and the surface preparation. There are numerous procedures for the various steps as well as criteria for material selection and the preparation of the materials.

Nuclear Science Abstracts

Nuclear Science Abstracts PDF Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1554

Book Description


NBS Technical Note

NBS Technical Note PDF Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 68

Book Description


Methods of Measurement for Semiconductor Materials, Process Control, and Devices; Quarterly Report

Methods of Measurement for Semiconductor Materials, Process Control, and Devices; Quarterly Report PDF Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 64

Book Description


Semiconductor Measurement Technology

Semiconductor Measurement Technology PDF Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48

Book Description


Semiconductor Measurement Technology

Semiconductor Measurement Technology PDF Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 140

Book Description


Methods of measurement for semiconductor materials, process control, and devices

Methods of measurement for semiconductor materials, process control, and devices PDF Author: W. Murray Bullis
Publisher:
ISBN:
Category :
Languages : en
Pages : 68

Book Description


Monthly Catalog of United States Government Publications, Cumulative Index

Monthly Catalog of United States Government Publications, Cumulative Index PDF Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : United States
Languages : en
Pages : 1348

Book Description


Monthly Catalog of United States Government Publications

Monthly Catalog of United States Government Publications PDF Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1320

Book Description