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Author: Selahattin Sayil Publisher: Springer Nature ISBN: 303112751X Category : Technology & Engineering Languages : en Pages : 142
Book Description
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Author: Selahattin Sayil Publisher: Springer Nature ISBN: 303112751X Category : Technology & Engineering Languages : en Pages : 142
Book Description
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Author: Josef Sikula Publisher: Springer Science & Business Media ISBN: 1402021704 Category : Technology & Engineering Languages : en Pages : 371
Book Description
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
Author: Alper Demir Publisher: Springer ISBN: Category : Computers Languages : en Pages : 296
Book Description
In electronic circuit and system design, the word noise is used to refer to any undesired excitation on the system. In other contexts, noise is also used to refer to signals or excitations which exhibit chaotic or random behavior. The source of noise can be either internal or external to the system. For instance, the thermal and shot noise generated within integrated circuit devices are in ternal noise sources, and the noise picked up from the environment through electromagnetic interference is an external one. Electromagnetic interference can also occur between different components of the same system. In integrated circuits (Ies), signals in one part of the system can propagate to the other parts of the same system through electromagnetic coupling, power supply lines and the Ie substrate. For instance, in a mixed-signal Ie, the switching activity in the digital parts of the circuit can adversely affect the performance of the analog section of the circuit by traveling through the power supply lines and the substrate. Prediction of the effect of these noise sources on the performance of an electronic system is called noise analysis or noise simulation. A methodology for the noise analysis or simulation of an electronic system usually has the following four components: 2 NOISE IN NONLINEAR ELECTRONIC CIRCUITS • Mathematical representations or models for the noise sources. • Mathematical model or representation for the system that is under the in fluence of the noise sources.
Author: M. Masud Hasan Chowdhury Publisher: ISBN: Category : Languages : en Pages :
Book Description
Continuous scaling of technologies towards the nanometer range will severely enhance noise and other implications, such as, leakage current levels, contributing to new power consumption sources. These trends are challenging traditional ways of noise avoidance and timing management. Therefore, the presented work must be extended to attempt developing new techniques for better performance in terms of noise immunity, reliability, energy efficiency, speed, and area requirements.
Author: Jeremy Ramsden Publisher: William Andrew ISBN: 0323393144 Category : Technology & Engineering Languages : en Pages : 361
Book Description
Nanotechnology: An Introduction, Second Edition, is ideal for the newcomer to nanotechnology, someone who also brings a strong background in one of the traditional disciplines, such as physics, mechanical or electrical engineering, or chemistry or biology, or someone who has experience working in microelectromechanical systems (MEMS) technology. This book brings together the principles, theory, and practice of nanotechnology, giving a broad, yet authoritative, introduction to the possibilities and limitations of this exciting and rapidly developing field. The book's author, Prof Ramsden, also discusses design, manufacture, and applications and their impact on a wide range of nanotechnology areas. Provides an overview of the rapidly growing and developing field of nanotechnology Focuses on key essentials, and structured around a robust anatomy of the subject Brings together the principles, theory, and practice of nanotechnology, giving a broad, yet authoritative, introduction to the possibilities and limitations of this exciting and rapidly developing field
Author: Nicola Da Dalt Publisher: Cambridge University Press ISBN: 131699306X Category : Technology & Engineering Languages : en Pages : 270
Book Description
Gain an intuitive understanding of jitter and phase noise with this authoritative guide. Leading researchers provide expert insights on a wide range of topics, from general theory and the effects of jitter on circuits and systems, to key statistical properties and numerical techniques. Using the tools provided in this book, you will learn how and when jitter and phase noise occur, their relationship with one another, how they can degrade circuit performance, and how to mitigate their effects - all in the context of the most recent research in the field. Examine the impact of jitter in key application areas, including digital circuits and systems, data converters, wirelines, and wireless systems, and learn how to simulate it using the accompanying Matlab code. Supported by additional examples and exercises online, this is a one-stop guide for graduate students and practicing engineers interested in improving the performance of modern electronic circuits and systems.
Author: R. Jacob Baker Publisher: John Wiley & Sons ISBN: 0470229411 Category : Technology & Engineering Languages : en Pages : 1074
Book Description
This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.
Author: Stephen A. Campbell Publisher: OUP USA ISBN: 9780195320176 Category : Technology & Engineering Languages : en Pages : 0
Book Description
Designed for advanced undergraduate or first-year graduate courses in semiconductor or microelectronic fabrication, the third edition of Fabrication Engineering at the Micro and Nanoscale provides a thorough and accessible introduction to all fields of micro and nano fabrication.
Author: Mark (Mohammad) Tehranipoor Publisher: Springer ISBN: 3319118242 Category : Technology & Engineering Languages : en Pages : 282
Book Description
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.
Author: Selahattin Sayil
Author: Selahattin Sayil
Author: Josef Sikula
Author: Alper Demir
Author: M. Masud Hasan Chowdhury
Author: Jeremy Ramsden
Author: Nicola Da Dalt
Author: R. Jacob Baker
Author: 
Author: Stephen A. Campbell
Author: Mark (Mohammad) Tehranipoor