New Trends and Developments in Metrology PDF Download

Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 9535124773
Category : Technology & Engineering
Languages : en
Pages : 294

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Book Description
Investigating the incessant technology growth and the even higher complexity of engineering systems, one of the crucial requirements to confidently steer both scientific and industrial challenges is to identify an appropriate measurement approach. A general process can be considered effective and under control if the following elements are consciously and cyclically managed: numeric target, adequate tools, output analysis, and corrective actions. The role of metrology is to rigorously harmonize this virtuous circle, providing guidance in terms of instruments, standards, and techniques to improve the robustness and the accuracy of the results. This book is designed to offer an interdisciplinary experience into the science of measurement, not only covering high-level measurement strategies but also supplying analytical details and experimental setups.

Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 1789844622
Category : Technology & Engineering
Languages : en
Pages : 108

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Book Description
The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.

Author: Bo Su
Publisher:
ISBN: 9781628416626
Category : Integrated circuits
Languages : en
Pages : 187

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Book Description
Metrology has grown significantly, especially in semiconductor manufacturing, and such growth necessitates increased expertise. Until now, this field has never had book written from the perspective of an engineer in a modern IC manufacturing and development environment. The topics in this Tutorial Text range from metrology at its most basic level to future predictions and challenges, including measurement methods, industrial applications, fundamentals of traditional measurement system characterization and calibration, measurement system characterization and calibration, semiconductor-specific applications, optical metrology measurement techniques, charged particle measurement techniques, x-ray and in situ metrology, hybrid metrology, and mask making. Includes example spreadsheets of measurement uncertainty analysis--specifically, precision, matching, and relative accuracy.

Author: Dinesh K. Aswal
Publisher: Springer Nature
ISBN: 9819920744
Category : Technology & Engineering
Languages : en
Pages : 2504

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Book Description
​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.

Author:
Publisher:
ISBN: 9789535124788
Category :
Languages : en
Pages :

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Book Description

Author: Olivério D.D. Soares
Publisher: Springer Science & Business Media
ISBN: 9400936095
Category : Science
Languages : en
Pages : 794

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Book Description
Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quality control, non-destructive tes ting and in fundamental research. In order to define the state-of-the-art, and to evaluate pre sent accomplishments, whilst giving an appraisal of how each of the particular topics will evolve the Optical Metrology-anAdvancedStudy Institute was organized with a concourse of the world's acknowledged experts. Thus, the Institute provided a forum for tutorial reviews blended with topics of current research in the form of a progressive and comprehensive presentation of recent promising developments, lea ding techniques and instrumentation in incoherent and coherent optics for Metrology, Sensing and Control in Science, Industry and Biomedici ne. Optical Metrology is a very broad field which is highly inter disciplinary in its applications, and in its scientific and technolo gical background. It is related to such diverse disciplines as physi cal and chemical sciences, engineering, electronics, computer scien ces, biological sciences and theoretical sciences, such as statistics. Although there was an emphasis on photomechanics and industri al applications, a marked diversity was reflected in the different background and interests of the participants. The vitality and viabi lity of the discipline was enhanced not only by the encouraging number of young scientists and industrialists participating and authoring, but also by the remarkably promising prospects found in x the practical applications supported by advanced electronic hybridi zation.

Author: Andre N. Luiten
Publisher: Springer Science & Business Media
ISBN: 3540449914
Category : Science
Languages : en
Pages : 396

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Book Description
This text on precision frequency measurement and its key enabling techniques includes reviews written by some of the most experienced researchers in their respective fields. This text should prove useful to researchers just entering the field of frequency metrology and standards, or equally well to the experienced practitioner.

Author: Wolfgang Osten
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471

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Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

Author: Yuri Mikhailovich Tsipenyuk
Publisher: EOLSS Publications
ISBN: 1905839545
Category :
Languages : en
Pages : 314

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Book Description
Physical Methods, Instruments and Measurements theme is a component of the Encyclopedia of Physical Sciences, Engineering and Technology Resources which is part of the global Encyclopedia of Life Support Systems (EOLSS), an integrated compendium of twenty Encyclopedias. The Theme provides a complete survey of the present status of our knowledge of modern physical instruments and measurements. It is organized in the following main topics: Measurements and Measurement Standards; Sources of Particles and Radiation, Detectors and Sensors; Imaging and Characterizing – Trace Element Analysis; Technology of Physical Experiments; Applications of Measurements and Instrumentation which are then expanded into multiple subtopics, each as a chapter. These four volumes are aimed at the following five major target audiences: University and College Students, Educators, Professional Practitioners, Research Personnel and Policy Analysts, Managers, and Decision Makers and NGOs

Author: D.P. Atherton
Publisher: Elsevier
ISBN: 1483298965
Category : Technology & Engineering
Languages : en
Pages : 259

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Book Description
This volume is the published Proceedings of selected papers from the IFAC Symposium, Swansea, 11-13 July 1988, where a forum was provided for discussion of the latest advances and techniques in the education of control and instrument engineers. Seven major topics were covered to aid lecturers in understanding, developing and presenting systems engineering - control and measurement - as a subject to undergraduate and postgraduate students. The teaching of real-time computer control as a topic and laboratory experiments for both continuous and discrete systems were discussed, as was process control, with the emphasis on providing the student with engineering experience by using scaled-down equipment which would teach practical skills. Included in the Proceedings are papers on measurement and instrumentation, an area felt to be neglected within academic instruction. The development of software tools for systems design within systems engineering was included, as was the exchange of teaching packages and methods between academics, and the education curriculum of systems engineering within developing countries. These Proceedings will prove to be a useful up-to-date guide and reference source for all lecturers and professors involved in curriculum development and the teaching of control and measurement in systems engineering.