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Author: National Research Council Publisher: National Academies Press ISBN: 0309176719 Category : Technology & Engineering Languages : en Pages : 190
Book Description
This book describes a vision of manufacturing in the twenty-first century that maximizes efficiencies and improvements by exploiting the full power of information and provides a research agenda for information technology and manufacturing that is necessary for success in achieving such a vision. Research on information technology to support product and process design, shop-floor operations, and flexible manufacturing is described. Roles for virtual manufacturing and the information infrastructure are also addressed. A final chapter is devoted to nontechnical research issues.
Author: National Research Council Publisher: National Academies Press ISBN: 0309176719 Category : Technology & Engineering Languages : en Pages : 190
Book Description
This book describes a vision of manufacturing in the twenty-first century that maximizes efficiencies and improvements by exploiting the full power of information and provides a research agenda for information technology and manufacturing that is necessary for success in achieving such a vision. Research on information technology to support product and process design, shop-floor operations, and flexible manufacturing is described. Roles for virtual manufacturing and the information infrastructure are also addressed. A final chapter is devoted to nontechnical research issues.
Book Description
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
Author: Thomas J. Drozda Publisher: Society of Manufacturing Engineers ISBN: 0872634027 Category : Technology & Engineering Languages : en Pages : 679
Book Description
Addresses important topics of DFM, including how it relates to concurrent engineering, management issues, getting started in DFM, how to justify using DFM, applying quality tools and how DFM is affecting computer technology (and vice versa). Covers topics starting with the creative thinking process, to combining DFM with geometric dimensioning and tolerancing. Also includes product design information that designers should know when committing pen to paper or mouse to mat.
Author: National Research Council Publisher: National Academies Press ISBN: 0309176670 Category : Technology & Engineering Languages : en Pages : 228
Book Description
Manufacturing, reduced to its simplest form, involves the sequencing of product forms through a number of different processes. Each individual step, known as an unit manufacturing process, can be viewed as the fundamental building block of a nation's manufacturing capability. A committee of the National Research Council has prepared a report to help define national priorities for research in unit processes. It contains an organizing framework for unit process families, criteria for determining the criticality of a process or manufacturing technology, examples of research opportunities, and a prioritized list of enabling technologies that can lead to the manufacture of products of superior quality at competitive costs. The study was performed under the sponsorship of the National Science Foundation and the Defense Department's Manufacturing Technology Program.
Author: National Research Council Publisher: National Academies Press ISBN: 0309092663 Category : Technology & Engineering Languages : en Pages : 123
Book Description
As the Department of Defense continues development of the future warrior system, the difficulty of moving rapidly from design to manufacturing for complex technologies is becoming a major concern. In particular, there are communication gaps between design and manufacturing that hinder rapid development of new products important for these future military developments. To help address those concerns, DOD asked the NRC to develop a framework for "bridging" these gaps through data management, modeling, and simulation. This report presents the results of this study. It provides a framework for virtual design and manufacturing and an assessment of the necessary tools; an analysis of the economic dimensions; an examination of barriers to virtual design and manufacturing in the DOD acquisition process; and a series of recommendations and research needs.
Author: Hubert Kaeslin Publisher: Cambridge University Press ISBN: 0521882672 Category : Technology & Engineering Languages : en Pages : 878
Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Author: Abraham Landzberg Publisher: Springer Science & Business Media ISBN: 1461520290 Category : Technology & Engineering Languages : en Pages : 663
Book Description
The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
Author: Advanced Research Projects Agency Staff Publisher: DIANE Publishing ISBN: 9780788103605 Category : Political Science Languages : en Pages : 132
Book Description
Addresses defense industry and technology base activities under eight separate statutory authority programs and sets forth planned selection criteria by which proposals received under a future solicitation will be evaluated. Covers: technology reinvestment activities (technology development, technology deployment, and manufacturing education and training), and eligibility and statutory programs. Also, planning for submission of proposals.
Author: National Research Council
Author: National Research Council
Author: José Pineda de Gyvez
Author: Thomas J. Drozda
Author: National Research Council
Author: National Research Council
Author: Hubert Kaeslin
Author: National Institute of Standards and Technology (U.S.)
Author: Abraham Landzberg
Author: Advanced Research Projects Agency Staff
Author: