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Author: Donald B. McComb Publisher: ISBN: Category : Languages : en Pages : 12
Book Description
The Modular Automatic Test Equipment (MATE) program currently does not address networking of Automatic Test Equipment (ATE). This paper discusses the economic advantages of the networking and some factors that should be considered when establishing a network. (JHD).
Author: Donald B. McComb Publisher: ISBN: Category : Languages : en Pages : 12
Book Description
The Modular Automatic Test Equipment (MATE) program currently does not address networking of Automatic Test Equipment (ATE). This paper discusses the economic advantages of the networking and some factors that should be considered when establishing a network. (JHD).
Author: Érika Cota Publisher: Springer Science & Business Media ISBN: 1461407915 Category : Technology & Engineering Languages : en Pages : 220
Book Description
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.
Author: Keith Brindley Publisher: Elsevier ISBN: 1483101150 Category : Technology & Engineering Languages : en Pages : 241
Book Description
Automatic Test Equipment provides a clear and concise discussion of automatic test equipment. The book is comprised of nine chapters that deal with both concepts and standards. Chapter 1 reviews the term of automatic test equipment, while Chapter 2 covers the types of test equipment. Chapter 3 discusses fixture, and Chapters 4 and 5 talk about the strategies, methods, and processes used by automatic test equipment systems. The book also deals with computer and instrument buses, and then covers general-purpose interface bus. The last two chapters discuss the VMEbus and VXIbus. The text will be of great use to practitioners from different fields who wish to utilize automatic test equipment in their work.
Author: J. Jayakumari Publisher: Springer Nature ISBN: 9811539928 Category : Technology & Engineering Languages : en Pages : 837
Book Description
This book presents the selected peer-reviewed papers from the International Conference on Communication Systems and Networks (ComNet) 2019. Highlighting the latest findings, ideas, developments and applications in all areas of advanced communication systems and networking, it covers a variety of topics, including next-generation wireless technologies such as 5G, new hardware platforms, antenna design, applications of artificial intelligence (AI), signal processing and optimization techniques. Given its scope, this book can be useful for beginners, researchers and professionals working in wireless communication and networks, and other allied fields.
Author: Amir Afshar Publisher: Elsevier ISBN: 0080539564 Category : Science Languages : en Pages : 229
Book Description
Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. - Introduces a novel component-testing philosophy for semiconductor test, product and design engineers - Best new source of information for experienced semiconductor engineers as well as entry-level personnel - Eight chapters about semiconductor testing
Author: Xiaohui Yuan Publisher: Springer Nature ISBN: 3030450996 Category : Computers Languages : en Pages : 248
Book Description
This volume presents selected papers from the International Conference on Urban Intelligence and Applications (ICUIA), which took place on May 10-12, 2019 in Wuhan, China. The goal of the conference was to bring together researchers, industry leaders, policy makers, and administrators to discuss emerging technologies and their applications to advance the design and implementation of intelligent utilization and management of urban assets, and thus contributing to the autonomous, reliable, and efficient operation of modern, smart cities. The papers are collated to address major themes of urban sustainability, urban infrastructure and management, smart city applications, image and signal processing, natural language processing, and machine learning for monitoring and communications applications. The book will be of interest to researchers and industrial practitioners working on geospatial theories and tools, smart city applications, urban mobility and transportation, and community well-being and management.
Author: Laung-Terng Wang Publisher: Morgan Kaufmann ISBN: 0080556809 Category : Technology & Engineering Languages : en Pages : 893
Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author: Donald B. McComb
Author: Donald B. McComb
Author: Érika Cota
Author: Automatic Testing Conference
Author: Allan C. Stover
Author: Keith Brindley
Author: J. Jayakumari
Author: Amir Afshar
Author: 
Author: Xiaohui Yuan
Author: Laung-Terng Wang