Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 148
Book Description
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Author: National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 148
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 148
Book Description
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author: Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category :
Languages : en
Pages : 1162
Book Description
First Text Retrieval Conference (TREC-1)
Author: D. K. HarmanPublisher: DIANE Publishing
ISBN: 0788125214
Category :
Languages : en
Pages : 527
Book Description
Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.
Proceedings of the NIST Centennial Standards Symposium
Author: Mary Jo DiBernardoGuidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results (rev. Ed. )
Author: Barry N. TaylorPublisher: DIANE Publishing
ISBN: 1437915566
Category : Science
Languages : en
Pages : 25
Book Description
Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Spreading Resistance Symposium
Author: James R. EhrsteinPublisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 146
Book Description