Author: Shih-Chien Yang
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages :
Book Description
Multiple Fault Detection in Logic Circuits
Author: Shih-Chien Yang
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages :
Book Description
Multiple Fault Detection in Digital Circuits
Author: Anastasios S. Vergis
Publisher:
ISBN:
Category :
Languages : en
Pages : 472
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 472
Book Description
Multiple Fault Detection for Combinational Circuits
Author: Gholam-Reza Fadakar
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 118
Book Description
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 118
Book Description
Multiple Fault Detection in Combinational Circuits
Author: Sivanarayana Mallela
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
Book Description
Multiple Fault Detection in Combinational Circuits
Rational Fault Analysis
Author: Richard Saeks
Publisher: Marcel Dekker
ISBN:
Category : Business & Economics
Languages : en
Pages : 264
Book Description
Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.
Publisher: Marcel Dekker
ISBN:
Category : Business & Economics
Languages : en
Pages : 264
Book Description
Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.
Fault Detection for Combinational Logic Under the Multiple Fault Assumption
Author: Patrick Wai-Fai Lam
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 92
Book Description
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 92
Book Description
Functional Method for Multiple Fault Detection and Location in Combinational Circuits
Author: Ka Ngow Wong
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 124
Book Description
Publisher:
ISBN:
Category : Electric circuits
Languages : en
Pages : 124
Book Description
Fault Masking in Combinational Logic Circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Publisher:
ISBN:
Category :
Languages : en
Pages : 40
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 40
Book Description
Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description