Author: Antoine DaridonPublisher:
ISBN:
Category :
Languages : en
Pages : 336
Book Description
Molecular Beam Epitaxy Growth and Electrochemical Investigations of La2CuO4 Thin-films
Author: Antoine DaridonGrowth of EuO Thin Films by Molecular Beam Epitaxy
Author: Ross UlbrichtEpitaxy
Author: Marian A. HermanPublisher: Springer Science & Business Media
ISBN: 9783540678212
Category : Science
Languages : en
Pages : 546
Book Description
In a uniform and comprehensive manner the authors describe all the important aspects of the epitaxial growth processes of solid films on crystalline substrates, e.g. processes in which atoms of the growing film mimic the arrangement of the atoms of the substrate. Emphasis is put on sufficiently fundamental and unequivocal presentation of the subject in the form of an easy-to-read review. A large part of this book focuses on the problems of heteroepitaxy. The most important epitaxial growth techniques which are currently widely used in basic research as well as in manufacturing processes of devices are presented and discussed in detail.
Growth of III-nitride Thin Films and Heterostructures by Gas-source Molecular Beam Epitaxy
Author: Li-Kang LiSome Investigations of Molecular Beam Epitaxial Growth of III-V Semiconductor Films Via Monte-Carlo Computer Simulations, Carrier Tunneling and Spectroscopic Ellipsometry
Author: A. MadbukarPublisher:
ISBN:
Category :
Languages : en
Pages : 5
Book Description
Experimental work this past year was primarily directed toward enhancing the growth and characterization capabilities of the PI's laboratory. Significant improvements were completed on the MBE system and the in-situ ellipsometry apparatus was demonstrated in a bread board setup. Theoretical work consisted of preliminary Monte-Carlo investigation of the MBE growth III-V compounds. Extensive progress was made on modeling the phase separation occurring during growth of Al(x)Ga(1-x)As on (110) GaAs. A mismatch induced, strain dependent exchange reaction between Al and Ga was shown to give long period variations in the Al concentration. The specific predictions of the theory will be tested in a collaborative effort with JPL.
Ceramic Abstracts
Author: Scientific and Technical Aerospace Reports
Author: Physics Briefs
Author: Engineered Materials Abstracts
Author: Surface and Thin Film Analysis
Author: Gernot FriedbacherPublisher: Wiley-VCH
ISBN: 9783527320479
Category : Technology & Engineering
Languages : en
Pages : 0
Book Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)