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Author: Thomas Vogt Publisher: Springer Science & Business Media ISBN: 146142190X Category : Science Languages : en Pages : 190
Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Author: Thomas Vogt Publisher: Springer Science & Business Media ISBN: 146142190X Category : Science Languages : en Pages : 190
Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Author: Thomas Vogt Publisher: Springer Science & Business Media ISBN: 1461421918 Category : Technology & Engineering Languages : en Pages : 190
Book Description
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Author: Peter W. Hawkes Publisher: Academic Press ISBN: 0323916473 Category : Technology & Engineering Languages : en Pages : 665
Book Description
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. - Includes authoritative coverage of many recent developments in wave electron optics - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Author: Publisher: World Scientific ISBN: 9811204586 Category : Computers Languages : en Pages : 1001
Book Description
This compendium provides a comprehensive collection of the emergent applications of big data, machine learning, and artificial intelligence technologies to present day physical sciences ranging from materials theory and imaging to predictive synthesis and automated research. This area of research is among the most rapidly developing in the last several years in areas spanning materials science, chemistry, and condensed matter physics.Written by world renowned researchers, the compilation of two authoritative volumes provides a distinct summary of the modern advances in instrument — driven data generation and analytics, establishing the links between the big data and predictive theories, and outlining the emerging field of data and physics-driven predictive and autonomous systems.
Author: Publisher: Academic Press ISBN: 0323850936 Category : Technology & Engineering Languages : en Pages : 296
Book Description
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Author: Peter W. Hawkes Publisher: Springer Nature ISBN: 3030000699 Category : Technology & Engineering Languages : en Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Author: The Minerals, Metals & Materials Society (TMS) Publisher: Springer ISBN: 3319482378 Category : Technology & Engineering Languages : en Pages : 1152
Book Description
These papers present advancements in all aspects of high temperature electrochemistry, from the fundamental to the empirical and from the theoretical to the applied. Topics involving the application of electrochemistry to the nuclear fuel cycle, chemical sensors, energy storage, materials synthesis, refractory metals and their alloys, and alkali and alkaline earth metals are included. Also included are papers that discuss various technical, economic, and environmental issues associated with plant operations and industrial practices.
Author: Salah H. R. Ali Publisher: CRC Press ISBN: 1315341190 Category : Science Languages : en Pages : 225
Book Description
In recent decades, metrology—an accurate and precise technology of high quality for automotive engines—has garnered a great deal of scientific interest due to its unique advanced soft engineering techniques in design and diagnostics. Used in a variety of scientific applications, these techniques are now widely regarded as safer, more efficient, and more effective than traditional ones. This book compiles and details the cutting-edge research in science and engineering from the Egyptian Metrology Institute (National Institute for Standards) that is revolutionizing advanced dimensional techniques through the development of coordinate and surface metrology.
Author: Thomas F. Kelly Publisher: Cambridge University Press ISBN: 1107162505 Category : Technology & Engineering Languages : en Pages : 263
Book Description
The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.
Author: Thomas Vogt
Author: Thomas Vogt
Author: Thomas Vogt
Author: Peter W. Hawkes
Author: 
Author: 
Author: Peter W. Hawkes
Author: The Minerals, Metals & Materials Society (TMS)
Author: Frances M. Ross
Author: Salah H. R. Ali
Author: Thomas F. Kelly