Author: Benjamin Rogel FavilaPublisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Model-based Fault Diagnosis of Digital Circuits
Fault Diagnosis of Digital Circuits
Author: V. N. YarmolikPublisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216
Book Description
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.
Model-Based Fault Diagnosis Techniques
Author: Steven X. DingPublisher: Springer Science & Business Media
ISBN: 1447147995
Category : Technology & Engineering
Languages : en
Pages : 533
Book Description
Guaranteeing a high system performance over a wide operating range is an important issue surrounding the design of automatic control systems with successively increasing complexity. As a key technology in the search for a solution, advanced fault detection and identification (FDI) is receiving considerable attention. This book introduces basic model-based FDI schemes, advanced analysis and design algorithms, and mathematical and control-theoretic tools. This second edition of Model-Based Fault Diagnosis Techniques contains: • new material on fault isolation and identification and alarm management; • extended and revised treatment of systematic threshold determination for systems with both deterministic unknown inputs and stochastic noises; • addition of the continuously-stirred tank heater as a representative process-industrial benchmark; and • enhanced discussion of residual evaluation which now deals with stochastic processes. Model-based Fault Diagnosis Techniques will interest academic researchers working in fault identification and diagnosis and as a text it is suitable for graduate students in a formal university-based course or as a self-study aid for practising engineers working with automatic control or mechatronic systems from backgrounds as diverse as chemical process and power engineering.
Model-based Fault Diagnosis in Dynamic Systems Using Identification Techniques
Author: Silvio SimaniPublisher: Springer Science & Business Media
ISBN: 1447138295
Category : Technology & Engineering
Languages : en
Pages : 294
Book Description
Safety in industrial process and production plants is a concern of rising importance but because the control devices which are now exploited to improve the performance of industrial processes include both sophisticated digital system design techniques and complex hardware, there is a higher probability of failure. Control systems must include automatic supervision of closed-loop operation to detect and isolate malfunctions quickly. A promising method for solving this problem is "analytical redundancy", in which residual signals are obtained and an accurate model of the system mimics real process behaviour. If a fault occurs, the residual signal is used to diagnose and isolate the malfunction. This book focuses on model identification oriented to the analytical approach of fault diagnosis and identification covering: choice of model structure; parameter identification; residual generation; and fault diagnosis and isolation. Sample case studies are used to demonstrate the application of these techniques.
Readings in Model-based Diagnosis
Author: Walter HamscherPublisher:
ISBN:
Category : Computers
Languages : en
Pages : 544
Book Description
This readings book is about artificial intelligence techniques for the diagnosis of engineered systems based on a general purpose model of the internal structure and behavior of the target device.
Fault Diagnosis in Digital Circuits
Author: Mohamed Saled Soliman MahmoudPublisher:
ISBN: 9780355460582
Category :
Languages : en
Pages :
Book Description
The goals of fault diagnosis are to ascertain whether faults are present in (fault detection) and to identify them (fault location). Fault location is commonly performed with the aid of a fault dictionary. Fault dictionaries are constructed via fault simulation under the single fault assumption. The single fault-model often assumes a circuit is tested often enough such that no more than one physical defect is likely to occur between two consecutive test applications. This strategy is not valid when one physical defect manifests itself as multiple faults. It is observed that the presence of redundant faults also invalidates the frequent testing strategy, since a redundant fault may mask the existence of a detectable fault. In all these situations, a multiple fault model is required. However, in almost all practical cases a fault dictionary for multiple faults is infeasible to generate due to an exponential number of equivalence classes. In this dissertation, we first present a VHDL-based CAD tool that integrates design error injection, simulation, and diagnosis for digital circuits. The tool uses an FPGA-based board to inject error models in the design and compute the error free and erroneous signatures of internal lines. The signatures are later used for detection and diagnosis of errors for the circuit under test (CUT). Several experiments were conducted to demonstrate the capabilities of the tool. The obtained results demonstrate that the tool could detect and locate the source faulty node(s) within the CUT. Then, a new approach for a developed fault diagnosis method. Our approach is based on an enhanced deduction algorithm, which processes the actual response (effect) of CUT, to determine fault situations (causes). The main tool of our approach processes the response to deduce the internal signal values. A multiple stuck at fault model is implicitly employed and no-fault enumeration is required. The enhanced deduction algorithm is applicable to complicated combinational circuits. The internal values obtained are used to determine fault situations in CUT compatible with the applied test T and the response. Our analysis can identify fault locations and values (s-a-0 or s-a-1). Our main result is that any stuck fault can be diagnosed. Preliminary results demonstrate that our technique always achieves great accuracy for detecting and locating the faults, saving a large amount of time, especially for more complicated combinational circuits. The problems solved by our procedure are using deterministic test vectors. We next present a new approach for a developed fault diagnosis method. Our approach is based on an enhanced deduction algorithm and a backtracking strategy which can be regarded as a recursive process of value justification in which we first justify (explain) the values obtained at the primary outputs (POs). To justify a (0) value on the output of a- NAND gate (assuming it is normal), we need all the gate inputs to be (1). To justify a (1) value we need at least one input to have value (0). All the known values of internal normal lines must be justified by values of their predecessors. When both 0 and 1 values have been deduced for a gate output and it is critical, it is identified as normal and all its currently known values are analyzed. In some cases, we need to decide to select one of the possible ways to justify a (1) value on the output of a- NAND gate. If a decision leads to an inconsistency (self-contradictory state) with the forward propagated value, the algorithm will backtrack to the last decision point and try an alternative decision. After a decision is made, all the implications resulting from that decision are performed. If no inconsistency is detected, a new decision point is necessary. Otherwise, a solution has been obtained. A solution is a set of values which could have occurred in the CUT, that is, a possible set of actual values. The main tool of our approach processes the response to deduce the internal signal values in all possible solutions.
Fault Diagnosis of Digital Systems
Author: Herbert Y. ChangPublisher: Krieger Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 186
Book Description
Model-based Fault Diagnosis Techniques
Author: Steven X. DingPublisher: Springer Science & Business Media
ISBN: 354076304X
Category : Technology & Engineering
Languages : en
Pages : 479
Book Description
The objective of this book is to introduce basic model-based FDI schemes, advanced analysis and design algorithms, and the needed mathematical and control theory tools at a level for graduate students and researchers as well as for engineers. This is a textbook with extensive examples and references. Most methods are given in the form of an algorithm that enables a direct implementation in a programme. Comparisons among different methods are included when possible.
Fault Diagnosis in Digital Circuits Based on Effect Cause Analysis
Author: Miron AbramoviciPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 530
Book Description
Bond Graph Model-based Fault Diagnosis of Hybrid Systems
Author: Wolfgang BorutzkyPublisher: Springer
ISBN: 3319118609
Category : Technology & Engineering
Languages : en
Pages : 283
Book Description
This book presents bond graph model-based fault detection with a focus on hybrid system models. The book addresses model design, simulation, control and model-based fault diagnosis of multidisciplinary engineering systems. The text beings with a brief survey of the state-of-the-art, then focuses on hybrid systems. The author then uses different bond graph approaches throughout the text and provides case studies.