Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category :
Languages : en
Pages : 28
Book Description
Model and Random Testing Properties of Intermittent Faults in Combinational Circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category :
Languages : en
Pages : 28
Book Description
Optimal random testing of single intermittent failures in combinational circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 30
Book Description
Detection of Intermittent Faults in Sequential Circuits
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category :
Languages : en
Pages : 40
Book Description
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
Testing for intermittent failures in combinational circuits by minimizing the mean testing time for a given test quality
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 40
Book Description
Testing for single intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 54
Book Description
Testing for multiple intermittent failures in combinational circuits by maximizing the probability of fault detection
Author: Stanford University Stanford Electronics Laboratories. Digital Systems LaboratoryPublisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 36
Book Description
The Evolution of Fault-Tolerant Computing
Author: A. AvizienisPublisher: Springer Science & Business Media
ISBN: 3709188717
Category : Computers
Languages : en
Pages : 467
Book Description
For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Diagnosis of Intermittent Faults in Digital Systems
Author: Samir KamalPublisher:
ISBN:
Category : Computers
Languages : en
Pages : 328
Book Description
FTCS-8
Author: Publisher:
ISBN:
Category : Electronic data processing
Languages : en
Pages : 252
Book Description
Author: