Mixed Signal Based Built-in Self-test for Analog Circuits PDF Download

Author: Kristi Maggard
Publisher:
ISBN:
Category :
Languages : en
Pages : 312

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Book Description

Author: Gordon W. Roberts
Publisher: Springer Science & Business Media
ISBN: 1461523419
Category : Technology & Engineering
Languages : en
Pages : 125

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Book Description
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Author: Charles E. Stroud
Publisher:
ISBN:
Category : Analog computer simultion
Languages : en
Pages : 0

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Book Description
A Built-In Self-Test architecture was developed for testing analog circuits in mixed-signal systems. The Built-In Self-Test circuitry primarily resides in the digital portion of the mixed-signal system in order to minimize performance impact on the analog circuitry. The test pattern generation portion of the Built-In Self-Test circuitry produces a number of different test waveforms found to be effective in detecting faults in the analog circuitry. The output response analysis function consists of a double-precision accumulator that facilitates determination of the faulty/fault-free status of an analog circuit with acceptable component parameter variations. Ten benchmark circuits were established for the evaluation of analog testing approaches along with acceptable component parameter variations and a standard set of faults and fault models for each benchmark circuit. Finally, an equation was developed for the calculation of analog fault coverage that takes into consideration the probability of potential detection of faults due to component parameter variation. Evaluation of the Built-In Self-Test architecture via analog fault simulation using the benchmark circuits and the fault coverage equation indicates that the approach is effective in detecting catastrophe and parametric faults in a wide variety of analog circuits.

Author: Charles E. Stroud
Publisher:
ISBN:
Category : Analog computer simultion
Languages : en
Pages : 128

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Book Description

Author: Bapiraju Vinnakota
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 296

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Book Description
More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.

Author: Jose Luis Huertas Díaz
Publisher: Springer Science & Business Media
ISBN: 0387235213
Category : Technology & Engineering
Languages : en
Pages : 310

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Book Description
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Author: Sameer Mangalampalli
Publisher:
ISBN:
Category :
Languages : en
Pages : 204

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Author: Jila Zakizadeh
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 0

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Book Description

Author: Prithviraj Kabisatpathy
Publisher: Springer Science & Business Media
ISBN: 0387257438
Category : Technology & Engineering
Languages : en
Pages : 183

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Book Description
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Author: Thomas Noulis
Publisher: CRC Press
ISBN: 1482260638
Category : Technology & Engineering
Languages : en
Pages : 420

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Book Description
Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.