Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Microelectronic Test Patterns NBS-12 and NBS-24
Microelectronic Test Pattern NBS-4
Author: W. Robert Thurber
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 96
Book Description
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 96
Book Description
Semiconductor Measurement Technology
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 128
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 128
Book Description
Microelectronic Test Pattern NBS-4
Semiconductor Measurement Technology
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 64
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 64
Book Description
Test Patterns NBS-28 and NBS-28A
Author: Michael A. Mitchell
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 60
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 60
Book Description
Publications of the National Bureau of Standards ... Catalog
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages : 612
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 612
Book Description
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 492
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 492
Book Description
Journal of Research of the National Bureau of Standards
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 784
Book Description
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 784
Book Description
Microelectronic Test Pattern NBS-3 for Evaluating the Resistivity-dopant Density Relationship of Silicon
Author: Martin G. Buehler
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 64
Book Description
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 64
Book Description