Author: Martin G. BuehlerPublisher:
ISBN:
Category :
Languages : en
Pages : 19
Book Description
Microelectronic Test Patterns: An Overview. U.S. Dep. of Commerce, National Bureau of Standards
Microelectronic Test Patterns
Author: Martin G. BuehlerPublisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 28
Book Description
Microelectronic Test Patterns
Author: Martin G. BuehlerMicroelectronic Test Pattern NBS-4
Author: W. Robert ThurberPublisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 83
Book Description
Microelectronic Test Patterns
Author: Martin G. BuehlerPublisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 28
Book Description
Microelectronic Test Patterns NBS-12 and NBS-24
Author: Microelectronic Test Pattern NBS-4
Author: W. Robert ThurberPublisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 96
Book Description
The United States Department of Commerce Publications, Catalog and Index Supplement
Author: United States. Department of CommercePublisher:
ISBN:
Category : Commerce
Languages : en
Pages : 100
Book Description
Microelectronic Test Pattern NBS-3 for Evaluating the Resistivity-dopant Density Relationship of Silicon
Author: Martin G. BuehlerPublisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 64
Book Description
Monthly Catalog of United States Government Publications
Author: Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1626
Book Description