Author: W. Robert Thurber
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 96
Book Description
Microelectronic Test Pattern NBS-4
Author: W. Robert Thurber
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 96
Book Description
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 96
Book Description
Microelectronic Test Pattern NBS-4
Author: W. Robert Thurber
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 83
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 83
Book Description
Semiconductor Measurement Technology
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 722
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 722
Book Description
Microelectronic Test Patterns
Author: Martin G. Buehler
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 28
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 28
Book Description
Test Patterns NBS-28 and NBS-28A
Author: Michael A. Mitchell
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 60
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 60
Book Description
Microelectronic Test Pattern NBS-3 for Evaluating the Resistivity-dopant Density Relationship of Silicon
Author: Martin G. Buehler
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 64
Book Description
Publisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 64
Book Description
National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 136
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 136
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
Semiconductor Measurement Technology
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 48
Book Description