Author: ARINC Research Corporation, Annapolis, MdPublisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 316
Book Description
Microelectronic Device Data Handbook: Text. -v. 2. Manufacturer and specific device information
Author: ARINC Research Corporation, Annapolis, MdPublisher:
ISBN:
Category : Microelectronics
Languages : en
Pages : 316
Book Description
NASA Scientific and Technical Reports
Author: United States. National Aeronautics and Space Administration Scientific and Technical Information DivisionPublisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 478
Book Description
A Selected Listing of NASA Scientific and Technical Reports
Author: United States. National Aeronautics and Space Administration. Scientific and Technical Information DivisionPublisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 470
Book Description
Scientific and Technical Aerospace Reports
Author: Classed Subject Catalog
Author: Engineering Societies LibraryPublisher:
ISBN:
Category : Classified catalogs (Universal decimal)
Languages : en
Pages : 550
Book Description
NASA SP.
Author: Monthly Catalog of United States Government Publications
Author: Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 2834
Book Description
Monthly Catalog of United States Government Publications
Author: United States. Superintendent of DocumentsPublisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1320
Book Description
Microelectronics Manufacturing Diagnostics Handbook
Author: Abraham LandzbergPublisher: Springer Science & Business Media
ISBN: 1461520290
Category : Technology & Engineering
Languages : en
Pages : 663
Book Description
The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.
Monthly Catalog of United States Government Publications, Cumulative Index
Author: United States. Superintendent of DocumentsPublisher:
ISBN:
Category : United States
Languages : en
Pages : 1348
Book Description