Metrology-measurement Assurance Program Guidelines PDF Download

Author: W. G. Eicke
Publisher:
ISBN:
Category :
Languages : en
Pages : 91

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Author: W. G. Eicke
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 112

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Author: National Aeronautics and Space Administration (NASA)
Publisher: Createspace Independent Publishing Platform
ISBN: 9781723207105
Category :
Languages : en
Pages : 106

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Book Description
The 5300.4 series of NASA Handbooks for Reliability and Quality Assurance Programs have provisions for the establishment and utilization of a documented metrology system to control measurement processes and to provide objective evidence of quality conformance. The intent of these provisions is to assure consistency and conformance to specifications and tolerances of equipment, systems, materials, and processes procured and/or used by NASA, its international partners, contractors, subcontractors, and suppliers. This Measurement Assurance Program (MAP) guideline has the specific objectives to: (1) ensure the quality of measurements made within NASA programs; (2) establish realistic measurement process uncertainties; (3) maintain continuous control over the measurement processes; and (4) ensure measurement compatibility among NASA facilities. The publication addresses MAP methods as applied within and among NASA installations and serves as a guide to: control measurement processes at the local level (one facility); conduct measurement assurance programs in which a number of field installations are joint participants; and conduct measurement integrity (round robin) experiments in which a number of field installations participate to assess the overall quality of particular measurement processes at a point in time. Eicke, W. G. and Riley, J. P. and Riley, K. J. Kennedy Space Center CALIBRATING; CONSISTENCY; HANDBOOKS; METROLOGY; QUALITY CONTROL; COMPATIBILITY; CONTRACTORS; COST EFFECTIVENESS; NASA PROGRAMS; RELIABILITY...

Author: Brian C. Belanger
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 76

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Author: John Keenan Taylor
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 320

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Book Description

Author: Paul E. Pontius
Publisher:
ISBN:
Category : Length measurement
Languages : en
Pages : 84

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Book Description

Author: Jerry L. Everhart
Publisher:
ISBN:
Category : Electronic measurements
Languages : en
Pages :

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Author: Brian C. Belanger
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 132

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Book Description

Author: United States. National Bureau of Standards. Office of Measurement Services
Publisher:
ISBN:
Category : Calibration
Languages : en
Pages : 24

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Book Description

Author: A.E. Fridman
Publisher: Springer Science & Business Media
ISBN: 1461414784
Category : Technology & Engineering
Languages : en
Pages : 222

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Book Description
This monograph and translation from the Russian describes in detail and comments on the fundamentals of metrology. The basic concepts of metrology, the principles of the International System of Units SI, the theory of measurement uncertainty, the new methodology of estimation of measurement accuracy on the basis of the uncertainty concept, as well as the methods for processing measurement results and estimating their uncertainty are discussed from the modern position. It is shown that the uncertainty concept is compatible with the classical theory of accuracy. The theory of random uncertainties is supplemented with their most general description on the basis of generalized normal distribution; the instrumental systematic errors are presented in connection with the methodology of normalization of the metrological characteristics of measuring instruments. The information about modern systems of traceability is given. All discussed theoretical principles and calculation methods are illustrated with examples.