Author: Rudolf F. Graf
Publisher: Elsevier
ISBN: 0080511341
Category : Technology & Engineering
Languages : en
Pages : 241
Book Description
This series of circuits provides designers with a quick source for measuring circuits. Why waste time paging through huge encyclopedias when you can choose the topic you need and select any of the specialized circuits sorted by application?This book in the series has 250-300 practical, ready-to-use circuit designs, with schematics and brief explanations of circuit operation. The original source for each circuit is listed in an appendix, making it easy to obtain additional information. - Ready-to-use circuits - Grouped by application for easy look-up - Circuit source listings
Measuring Circuits
Author: Rudolf F. Graf
Publisher: Elsevier
ISBN: 0080511341
Category : Technology & Engineering
Languages : en
Pages : 241
Book Description
This series of circuits provides designers with a quick source for measuring circuits. Why waste time paging through huge encyclopedias when you can choose the topic you need and select any of the specialized circuits sorted by application?This book in the series has 250-300 practical, ready-to-use circuit designs, with schematics and brief explanations of circuit operation. The original source for each circuit is listed in an appendix, making it easy to obtain additional information. - Ready-to-use circuits - Grouped by application for easy look-up - Circuit source listings
Publisher: Elsevier
ISBN: 0080511341
Category : Technology & Engineering
Languages : en
Pages : 241
Book Description
This series of circuits provides designers with a quick source for measuring circuits. Why waste time paging through huge encyclopedias when you can choose the topic you need and select any of the specialized circuits sorted by application?This book in the series has 250-300 practical, ready-to-use circuit designs, with schematics and brief explanations of circuit operation. The original source for each circuit is listed in an appendix, making it easy to obtain additional information. - Ready-to-use circuits - Grouped by application for easy look-up - Circuit source listings
High Frequency Measurements and Noise in Electronic Circuits
Author: Douglas C. Smith
Publisher: Springer Science & Business Media
ISBN: 0442006365
Category : Technology & Engineering
Languages : en
Pages : 252
Book Description
This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits as well as methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods. Demonstrating the innovative solutions he developed as a Distinguished Member of Technical Staff at AT&T/Bell Laboratories, solutions which earned him numerous U.S. and foreign patents, Douglas Smith has written the most definitive work on this subject. Smith explains design problems related to the new high frequency electronic standards, and then systematically provides laboratory proven methods for making accurate noise measurements, while demonstrating how these results should be interpreted. The technical background needed to conduct these experiments is provided as an aid to the novice, and as a reference for the professional. Smith also discusses theoretical concepts as they relate to practical applications. Many of the techniques Smith details in this book have been previously unpublished, and have been proven to solve problems in hours rather than in the days or weeks of effort it would take conventional techniques to yield results. Comprehensive and informative, this volume provides detailed coverage of such areas as: scope probe impedance, grounding, and effective bandwidth, differential measurement techniques, noise source location and identification, current probe characteristics, operation, and applications, characteristics of sources of interference to measurements and the minimization of their effects, minimizing coupling of external noise into the equipment under test by measurements, estimating the effect of a measurement on equipment operation, using digital scopes for single shot noise measurements, prediction of equipment electromagnetic interference (EMI) emission and susceptibility of performance, null experiments for validating measurement data, the relationship between high frequency noise and final product reliability. With governmental regulations and MIL standards now governing the emission of high frequency electronic noise and the susceptibility to pulsed EMI, the information presented in this guide is extremely pertinent. Electrical engineers will find High Frequency Measurements and Noise in Electronic Circuits an essential desktop reference for information and solutions, and engineering students will rely on it as a virtual source book for deciphering the "mysteries" unique to high frequency electronic circuits.
Publisher: Springer Science & Business Media
ISBN: 0442006365
Category : Technology & Engineering
Languages : en
Pages : 252
Book Description
This ready reference provides electrical engineers with practical information on accurate methods for measuring signals and noise in electronic circuits as well as methods for locating and reducing high frequency noise generated by circuits or external interference. Engineers often find that measuring and mitigating high frequency noise signals in electronic circuits can be problematic when utilizing common measurement methods. Demonstrating the innovative solutions he developed as a Distinguished Member of Technical Staff at AT&T/Bell Laboratories, solutions which earned him numerous U.S. and foreign patents, Douglas Smith has written the most definitive work on this subject. Smith explains design problems related to the new high frequency electronic standards, and then systematically provides laboratory proven methods for making accurate noise measurements, while demonstrating how these results should be interpreted. The technical background needed to conduct these experiments is provided as an aid to the novice, and as a reference for the professional. Smith also discusses theoretical concepts as they relate to practical applications. Many of the techniques Smith details in this book have been previously unpublished, and have been proven to solve problems in hours rather than in the days or weeks of effort it would take conventional techniques to yield results. Comprehensive and informative, this volume provides detailed coverage of such areas as: scope probe impedance, grounding, and effective bandwidth, differential measurement techniques, noise source location and identification, current probe characteristics, operation, and applications, characteristics of sources of interference to measurements and the minimization of their effects, minimizing coupling of external noise into the equipment under test by measurements, estimating the effect of a measurement on equipment operation, using digital scopes for single shot noise measurements, prediction of equipment electromagnetic interference (EMI) emission and susceptibility of performance, null experiments for validating measurement data, the relationship between high frequency noise and final product reliability. With governmental regulations and MIL standards now governing the emission of high frequency electronic noise and the susceptibility to pulsed EMI, the information presented in this guide is extremely pertinent. Electrical engineers will find High Frequency Measurements and Noise in Electronic Circuits an essential desktop reference for information and solutions, and engineering students will rely on it as a virtual source book for deciphering the "mysteries" unique to high frequency electronic circuits.
Weapon Control Systems Technician (F-4C/D: APQ-109/APA-165), (AFSC 32172P)
Author: James O'Hair
Publisher:
ISBN:
Category : Electronic technicians
Languages : en
Pages : 78
Book Description
Publisher:
ISBN:
Category : Electronic technicians
Languages : en
Pages : 78
Book Description
The Amplitude of Forced Oscillations in Vacuum Tube Circuits
Author: Rene Albert Braden
Publisher:
ISBN:
Category : Oscillations
Languages : en
Pages : 304
Book Description
Publisher:
ISBN:
Category : Oscillations
Languages : en
Pages : 304
Book Description
AF Manual
Author: United States. Department of the Air Force
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 832
Book Description
Publisher:
ISBN:
Category : Aeronautics, Military
Languages : en
Pages : 832
Book Description
Air Force AFM.
Inductive Interference Between Electric Power and Communication Circuits
Author: California Public Utilities Commission. Joint Committee on Inductive Interference
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 1212
Book Description
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 1212
Book Description
Printed Circuit Techniques
Author: Benjamin Lawrence Davis
Publisher:
ISBN:
Category : Electric resistors
Languages : en
Pages : 386
Book Description
Publisher:
ISBN:
Category : Electric resistors
Languages : en
Pages : 386
Book Description
Cyber-Physical Systems and Control II
Author: Dmitry G. Arseniev
Publisher: Springer Nature
ISBN: 3031208757
Category : Technology & Engineering
Languages : en
Pages : 682
Book Description
The book contains selected research papers presented at the 2nd International Conference on Cyber-Physical Systems and Control (CPS&C’2021) which was held from 29 June to 2 July 2021 in St. Petersburg, Russia. The CPS&C’2021 Conference continues the series of international conferences that began in 2019 when the first International Conference on Cyber-Physical Systems and Control (CPS&C’2019) took place. Cyber-physical systems (CPSs) considered a modern and rapidly emerging generation of systems with integrated wide computational, information processing, and physical capabilities that can interact with humans through many new modalities and application areas of implementation. The book covers the latest advances, developments and achievements in new theories, algorithms, models, and applications of prospective problems associated with CPSs with an emphasis on control theory and related areas. The multidisciplinary fundamental scientific and engineering principles that underpin the integration of cyber and physical elements across all application areas are discussed in the book chapters. The materials of the book may be of interest to scientists and engineers working in the field of cyber-physical systems, systems analysis, control systems, computer technologies, and similar fields.
Publisher: Springer Nature
ISBN: 3031208757
Category : Technology & Engineering
Languages : en
Pages : 682
Book Description
The book contains selected research papers presented at the 2nd International Conference on Cyber-Physical Systems and Control (CPS&C’2021) which was held from 29 June to 2 July 2021 in St. Petersburg, Russia. The CPS&C’2021 Conference continues the series of international conferences that began in 2019 when the first International Conference on Cyber-Physical Systems and Control (CPS&C’2019) took place. Cyber-physical systems (CPSs) considered a modern and rapidly emerging generation of systems with integrated wide computational, information processing, and physical capabilities that can interact with humans through many new modalities and application areas of implementation. The book covers the latest advances, developments and achievements in new theories, algorithms, models, and applications of prospective problems associated with CPSs with an emphasis on control theory and related areas. The multidisciplinary fundamental scientific and engineering principles that underpin the integration of cyber and physical elements across all application areas are discussed in the book chapters. The materials of the book may be of interest to scientists and engineers working in the field of cyber-physical systems, systems analysis, control systems, computer technologies, and similar fields.
Instruments and Measurements
Author: Helge Von Koch
Publisher: Elsevier
ISBN: 0323147364
Category : Science
Languages : en
Pages : 521
Book Description
Instruments and Measurements: Chemical Analysis, Electric Quantities, Nucleonics and Process Control, Volume I covers the proceedings of the Fifth International Instruments and Measurements Conference, held in Stockholm, Sweden on September 13-16, 1960. Separating 120 lectures into 49 chapters, this book is divided into five sections. The first section discusses the advances in automatic process control instrumentation, including developments in pneumatic, electropneumatic, and electrohydraulic control. This section deals also with the stability, optimization, and use of fast digital computer for process control applications. The subsequent two sections consider the physical methods of chemical analysis and nuclear instrumentation. These sections survey the developments in gas chromatography, mass spectrometry, and quadrupole mass filter for chemical analysis. These topics are followed by discussions on some structural and analytical applications of high resolution nuclear magnetic resonance. The remaining sections explore the measurements of electric and magnetic quantities, as well as the reactor control. These sections are devoted to X-ray methods, UV spectroscopy, turbidimeter, and infrared techniques. Analytical chemists, process and instrumentation engineers, and researchers in instruments, chemical analysis, and process control fields will find this book invaluable.
Publisher: Elsevier
ISBN: 0323147364
Category : Science
Languages : en
Pages : 521
Book Description
Instruments and Measurements: Chemical Analysis, Electric Quantities, Nucleonics and Process Control, Volume I covers the proceedings of the Fifth International Instruments and Measurements Conference, held in Stockholm, Sweden on September 13-16, 1960. Separating 120 lectures into 49 chapters, this book is divided into five sections. The first section discusses the advances in automatic process control instrumentation, including developments in pneumatic, electropneumatic, and electrohydraulic control. This section deals also with the stability, optimization, and use of fast digital computer for process control applications. The subsequent two sections consider the physical methods of chemical analysis and nuclear instrumentation. These sections survey the developments in gas chromatography, mass spectrometry, and quadrupole mass filter for chemical analysis. These topics are followed by discussions on some structural and analytical applications of high resolution nuclear magnetic resonance. The remaining sections explore the measurements of electric and magnetic quantities, as well as the reactor control. These sections are devoted to X-ray methods, UV spectroscopy, turbidimeter, and infrared techniques. Analytical chemists, process and instrumentation engineers, and researchers in instruments, chemical analysis, and process control fields will find this book invaluable.