Author: Wendong Zhang
Publisher: John Wiley & Sons
ISBN: 1118717961
Category : Technology & Engineering
Languages : en
Pages : 341
Book Description
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices